Nano, Quantum and Molecular Computing
DOI: 10.1007/1-4020-8068-9_3
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Defect Tolerance at the End of the Roadmap

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Cited by 59 publications
(30 citation statements)
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“…defective. One of the easiest test circuits proposed for such purposes is a counter circuit [21]. Counter circuits with thresholds of t can indicate 0,1,2,y,t or more than t defects.…”
Section: Methodsmentioning
confidence: 99%
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“…defective. One of the easiest test circuits proposed for such purposes is a counter circuit [21]. Counter circuits with thresholds of t can indicate 0,1,2,y,t or more than t defects.…”
Section: Methodsmentioning
confidence: 99%
“…Reconfigurable fabrics are composed of programmable logic elements [like configurable logic blocks (CLBs)] and interconnects which can be configured to implement any logic circuit. It is expected that reconfigurable fabrics made from next generation fabrication processes will go through a postfabrication defect mapping phase during which these fabrics are configured for self-diagnosis [20,21]. Thus, defect tolerance in such fabrics can be achieved by detecting faulty components during an initial defect map phase and excluding them during actual configuration.…”
Section: Defect Tolerance Through Reconfigurationmentioning
confidence: 99%
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