Deflectometry using a Hartmann screen to measure tilt, decentering and focus errors in a spherical surface

Muñoz-Potosi, A.F.; Granados-Agustín, Fermín; Campos‐García, Manuel; Valdivieso-González, L. G.; Percino-Zacarías, M. E.

doi:10.1016/j.optcom.2017.06.017

Cited by 6 publications

(2 citation statements)

References 15 publications

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“…In the past few years, various deflectometric methods and systems have been proposed to achieve accurate optical testing, including the astronomical telescope mirrors [6], spherical surfaces [7], aspheric mirrors [8,9], specular freeform mirrors [10] and precision x-ray mirrors [11]. Compared to interferometrical methods, the deflectometry is much lower in cost due to its simple system configuration, simply consisting of a projection screen, CCD camera and test object.…”

Section: Introductionmentioning

confidence: 99%

Instantaneous wavefront measurement based on deflectometry

Xie

Wang

et al. 2019

Optical Design and Testing IX

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The deflectometry enables high-precision wavefront measurement with large dynamic range. Traditional multi-step phase-shifting fringe-illumination deflectometric methods involve at least three sinusoidal phase-shifting fringe patterns and require a sequential projection, making it not feasible for the instantaneous measurement. In this paper, a colorcoded method with frequency-carrier patterns is proposed to achieve the instantaneous wavefront measurement based on deflectometry. With the color extraction from different channels, composite patterns in x and y directions can be well separated with a single shot. Then, the phase-shifting patterns encoded in different frequencies can be demodulated with the designed filters, by which the local wavefront slopes can be obtained simultaneously to reconstruct the wavefront under test. Both the numerical simulation and experiments are performed to validate the feasibility of proposed method. The proposed method provides a feasible way for the real-time and instantaneous measurement with large dynamic range based on deflectometry.

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Section: Introductionmentioning

confidence: 99%

Instantaneous wavefront measurement based on deflectometry

Xie

Wang

et al. 2019

Optical Design and Testing IX

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“…For high lateral resolution and avoiding aliasing effects, a dense grid is desirable. A dense grid, however, masks the original Makyoh image, thus hindering the observation of the morphology: the method can no longer be strictly treated as 'Makyoh topography', rather, we obtain a variation of the well known deflectometry [10] methods. (We note here that in this 'deflectomery mode', the mask does not need to be a grid; any two-dimensional periodic pattern, e.g., a Hartmann mask is suitable.)…”

Section: Introduction and Basic Conceptsmentioning

confidence: 99%

Structured-illumination Makyoh-topography: optimum grid position and its constraints

Riesz¹

2018

Surf. Topogr.: Metrol. Prop.

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Complementing conventional Makyoh topography with structured illumination using a sparse square grid, the large-scale surface shape can be calculated with a deflectometry approach, while the sample's morphology can still be imaged. However, the grid's image must be sharp not to mask the Makyoh image of the sample morphology. In this paper, the instrumental conditions for the grid sharpness are established. The two main types of Makyoh set-ups (lens and mirror based) are analysed. It is shown that the lens-based set-ups allow the position of the grid to be sharp on the Makyoh image. However, for mirror-based set-ups this is not possible because of geometrical instrumental constraints. The calculations are corroborated with experiments.

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Optical centering method for lens assembly based on fiber point diffraction interferometry

Chen

Geng

et al. 2023

Optics Communications

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Deflectometry using a Hartmann screen to measure tilt, decentering and focus errors in a spherical surface

Cited by 6 publications

References 15 publications

Instantaneous wavefront measurement based on deflectometry

Instantaneous wavefront measurement based on deflectometry

Structured-illumination Makyoh-topography: optimum grid position and its constraints

Optical centering method for lens assembly based on fiber point diffraction interferometry

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