2015 IEEE 65th Electronic Components and Technology Conference (ECTC) 2015
DOI: 10.1109/ectc.2015.7159780
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Degradation of Cu-Al wire bonded contacts under high current and high temperature conditions using in-situ resistance monitoring

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Cited by 10 publications
(1 citation statement)
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“…Failures caused by corrosion will limit the application range. 15,16 Huang et al 17 showed that the fracture position of all such solder joints was between the aluminum side and solder layer, while the strength of aluminum-containing solder joints was the highest. After corrosion, the order of the shear strength decrease rate of the solder joint was the same as that of the solder.…”
Section: Introductionmentioning
confidence: 99%
“…Failures caused by corrosion will limit the application range. 15,16 Huang et al 17 showed that the fracture position of all such solder joints was between the aluminum side and solder layer, while the strength of aluminum-containing solder joints was the highest. After corrosion, the order of the shear strength decrease rate of the solder joint was the same as that of the solder.…”
Section: Introductionmentioning
confidence: 99%