1997
DOI: 10.1016/s0379-6779(97)81229-5
|View full text |Cite
|
Sign up to set email alerts
|

Degradation of polymer-based light-emitting diodes during operation

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

1
23
0

Year Published

2001
2001
2022
2022

Publication Types

Select...
6
3

Relationship

0
9

Authors

Journals

citations
Cited by 24 publications
(24 citation statements)
references
References 18 publications
1
23
0
Order By: Relevance
“…In this case spectroscopic methods such as scanning tunneling microscopy (STM) [12], transmission electron microscopy (TEM) [13], scanning electron microscopy (SEM) [14] and atomic force microscopy (ATM) [15] are used. Causes for device failures due to crystallization and inter diffusion of organic layers were reported by Adachi et al [16] and Han et al [17].…”
Section: Introductionmentioning
confidence: 99%
“…In this case spectroscopic methods such as scanning tunneling microscopy (STM) [12], transmission electron microscopy (TEM) [13], scanning electron microscopy (SEM) [14] and atomic force microscopy (ATM) [15] are used. Causes for device failures due to crystallization and inter diffusion of organic layers were reported by Adachi et al [16] and Han et al [17].…”
Section: Introductionmentioning
confidence: 99%
“…This kind of behavior has previously been identied as one important material property for the improvement of OLED lifetimes. 24,[33][34][35] Therefore, the results obtained will be valuable for the development of future dihydroindeno [1,2-b]uorene-based materials and may be transferable to related structures and applications.…”
Section: Discussionmentioning
confidence: 99%
“…The first is that under light irradiation, the electro-optical properties of the P3OT are much more affected that the morphology. It is commonly accepted that the breakdown of polymer-based photodevices is correlated with nanomorphology changes since after irradiation a sample topology change is usually found and different features such as pitches, agglomerates, wires, or phase segregation appear when the polymer is blended [36,37]. However, for the irradiation exposures used in the present study, the polymer is already degraded from an electro-optical point of view, and therefore it becomes useless for optoelectronic applications, before substantial changes in the morphology are visible even if an etching of 4 nm is found (total thickness 100 nm).…”
Section: Discussionmentioning
confidence: 99%