2000
DOI: 10.1016/s0022-3093(99)00937-0
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Density of states in the channel material of low temperature polycrystalline silicon thin film transistors

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Cited by 11 publications
(2 citation statements)
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“…Despite this drawback, the analysis of the MPC data can provide important parameters (Table I) of the above inhomogeneous materials, such as average trap distributions and attempt to escape frequencies, which are in agreement with those obtained by other techniques. [33][34][35] In addition, we have found that the MPC measurements of pentacene films are compatible with the fact that the majority carriers from an effective transport path interact via trapping and thermal release with broad trap distributions. 24 The notion of the effective transport path of the majority carriers deals with either transport in the delocalized states or transport by hopping.…”
Section: Introductionsupporting
confidence: 63%
“…Despite this drawback, the analysis of the MPC data can provide important parameters (Table I) of the above inhomogeneous materials, such as average trap distributions and attempt to escape frequencies, which are in agreement with those obtained by other techniques. [33][34][35] In addition, we have found that the MPC measurements of pentacene films are compatible with the fact that the majority carriers from an effective transport path interact via trapping and thermal release with broad trap distributions. 24 The notion of the effective transport path of the majority carriers deals with either transport in the delocalized states or transport by hopping.…”
Section: Introductionsupporting
confidence: 63%
“…The first observation is the low defect density in the grain boundaries of such organic material. For comparison, the same model gives an order of 10 12 /cm 2 for N T in polycrystalline silicon transistors considering a channel thickness of 30 nm [20].…”
Section: Morphology Of C 60 Active Layer As a Function Of The Annealimentioning
confidence: 99%