Dependable Multicore Architectures at Nanoscale 2017
DOI: 10.1007/978-3-319-54422-9_2
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Dependability Threats

Abstract: The increasing diversity, density, and complexity of electronic devices is enabling the so-called digital revolution with the evident pervasive presence of electronics in everybody's lives. The benefits of this ubiquitous presence are impressive and widespread: from the constant improvement of productivity in the workplace to the societal impact of a constantly connected and sharing community.Whatever is the considered scenario, all this incredible progress has been relying on the assumption that the devices c… Show more

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Cited by 1 publication
(3 citation statements)
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“…The latest manufacturing processes are already producing 7 nm devices thanks to the advances in CMOS downscaling technology, manufacturing processes and electronic design automation tools [5,18]. Nevertheless, this CMOS technology downscaling leads to several threats that contribute to reliability degradation such as [32,33,34,5,35,36]:…”
Section: Reliability Degradation Threatsmentioning
confidence: 99%
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“…The latest manufacturing processes are already producing 7 nm devices thanks to the advances in CMOS downscaling technology, manufacturing processes and electronic design automation tools [5,18]. Nevertheless, this CMOS technology downscaling leads to several threats that contribute to reliability degradation such as [32,33,34,5,35,36]:…”
Section: Reliability Degradation Threatsmentioning
confidence: 99%
“…• Transient faults and soft errors: Soft-errors are caused by environmental conditions (e.g., α-particles, cosmic rays, ionizing radiation, EMI, cross-talk) leading to a transient perturbation that can be manifested as memory bit-flip in memory cells or combinatorial logic result error [32,33,39]. If the perturbation affects a single cell the event is called Single Event Upset (SEU), and if it affects more than one the event is called Multiple Bit Upset (MBU).…”
Section: Reliability Degradation Threatsmentioning
confidence: 99%
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