2001
DOI: 10.1116/1.1409378
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Deposition of diamond films at low pressure in a planar large-area microwave surface wave plasma source

Abstract: Particle generation and thin film surface morphology in the tetraethylorthosilicate/oxygen plasma enhanced chemical vapor deposition process In this study a planar large-area microwave plasma source is used to grow diamond films at low gas pressure. This plasma source is based on the excitation of plasma surface waves so that overdense plasmas can be generated. Above all, this plasma source is easy to scale up. For admixture of CH 4 /H 2 gas, radical information and characteristics of the plasma are carefully … Show more

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Cited by 7 publications
(2 citation statements)
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“…Details about the planar MPECVD system can be found in the literature. 20,21 Before the deposition of a-C, the chamber was first pumped to a base pressure of 5ϫ10 Ϫ3 Torr, and H 2 /CH 4 with a flow rate of 47/14 sccm was fed into the chamber to ignite the H 2 /CH 4 mixed plasma operated at 3000 W and 0.14 Torr. The a-C was then deposited onto the copper substrates at different bias voltages for 2 h at 200°C.…”
Section: Methodsmentioning
confidence: 99%
“…Details about the planar MPECVD system can be found in the literature. 20,21 Before the deposition of a-C, the chamber was first pumped to a base pressure of 5ϫ10 Ϫ3 Torr, and H 2 /CH 4 with a flow rate of 47/14 sccm was fed into the chamber to ignite the H 2 /CH 4 mixed plasma operated at 3000 W and 0.14 Torr. The a-C was then deposited onto the copper substrates at different bias voltages for 2 h at 200°C.…”
Section: Methodsmentioning
confidence: 99%
“…The results confirm that high radical fluxes are essential for the deposition under low-energy ion bombardment. Surface-wave excited plasma (SWP) has recently been used in a few studies [41]- [43]. The primary merit of SWP is its potential to enlarge the deposition area by adjusting an arrangement of slot antennas and a dielectric window.…”
Section: Diamond Deposition With Low-energy Ion Bombardmentmentioning
confidence: 99%