1995
DOI: 10.1016/0925-9635(94)00253-3
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Deposition of diamond on patterned silicon substrates

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Cited by 16 publications
(2 citation statements)
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“…The origin of these peaks is still a subject of discussion, but is commonly associated to trans-poly acetylene present on the NCD surface. And finally the sharp peak at 1333 cm −1 caused by the first order Raman response of diamond [18,[26][27][28]. Two laser lines were employed for the Raman measurements, the 514 nm (green) line for comparison with results found in the literature and a 325 nm (UV).…”
Section: Film Characterizationmentioning
confidence: 99%
See 1 more Smart Citation
“…The origin of these peaks is still a subject of discussion, but is commonly associated to trans-poly acetylene present on the NCD surface. And finally the sharp peak at 1333 cm −1 caused by the first order Raman response of diamond [18,[26][27][28]. Two laser lines were employed for the Raman measurements, the 514 nm (green) line for comparison with results found in the literature and a 325 nm (UV).…”
Section: Film Characterizationmentioning
confidence: 99%
“…In addition, threedimensional patterned substrates are a useful tool for the study and modelling of CVD growth [15][16][17], which is still not fully understood. Floter et al [18] in 1995, reported a strong dependence of the nucleation density on the orientation of the surface when bias pre-treatment of structured Si substrate was employed. This lead to a very low or absent diamond growth on the side-wall of trenches.…”
Section: Introductionmentioning
confidence: 99%