Deposition of Gd2Zr2O7 single buffer layers with different thickness for YBa2Cu3O7−δ coated conductors on metallic substrates

Ying, Liliang; Feng, Feng; Gao, Bo; Yu-qi, LU; Liu, Z.Y.; Cai, Chuanbing; Hühne, Ruben; Holzäpfel, B.

doi:10.1016/j.physc.2010.04.014

Cited by 13 publications

(3 citation statements)

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“…∼2.5% and 4.2% for YBCO a and b axes, respectively) and the NiW alloy substrate underneath (∼5.56%) and excellent barrier behavior against oxygen diffusion. Successful production of GZO films by means of physical or chemical techniques on textured substrates or single crystals has been demonstrated, proving that critical current densities at the MA cm −2 level of YBCO layers can be achieved [14,15]. Additionally, the GZO is one of the few materials with pinhole free microstructure in the films deposited by the chemical solution method up to now.…”

Section: Introductionmentioning

confidence: 99%

Development of all chemical solution derived Ce_0.9La_0.1O_{2 −y}/Gd₂Zr₂O₇buffer layer stack for coated conductors: influence of the post-annealing process on surface crystallinity

Zhao¹,

Li²,

Khoryushin³

et al. 2011

Supercond. Sci. Technol.

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Preparation and characterization of a biaxially textured Gd 2 Zr 2 O 7 and Ce 0.9 La 0.1 O 2−y (CLO, cap)/Gd 2 Zr 2 O 7 (GZO, barrier) buffer layer stack by the metal-organic deposition route are reported. YBa 2 Cu 3 O 7−d (YBCO) superconductor films were deposited by the pulsed-laser deposition (PLD) technique to assess the efficiency of such a novel buffer layer stack. Biaxial texture quality and morphology of the buffer layers and the YBCO superconductor films were fully characterized. The surface crystallinity of the buffer layers is studied by the electron backscatter diffraction technique. It is revealed that post-annealing GZO films in 2% H 2 in Ar is an effective way to improve the surface crystallinity. As a result, a highly textured CLO film can grow directly on the GZO film at a lower crystallization temperature. The critical current density of a YBCO PLD film is higher than 1 MA cm −2 (@77 K, in self-field), demonstrating that the novel CLO/GZO stack is very promising for further development of low cost buffer layer architectures for coated conductors.

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Section: Introductionmentioning

confidence: 99%

Development of all chemical solution derived Ce_0.9La_0.1O_{2 −y}/Gd₂Zr₂O₇buffer layer stack for coated conductors: influence of the post-annealing process on surface crystallinity

Zhao¹,

Li²,

Khoryushin³

et al. 2011

Supercond. Sci. Technol.

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“…Due to the complex processing and the high cost for such multi-layer structures, it is highly desired to find more effective buffer architecture to simplify the preparation and thus to reduce the cost of production. Recently, single buffers such as La 2 Zr 2 O 7 or Ga 2 Zr 2 O 7 deposited by pulsed laser deposition were studied carefully in our group [15][16][17].…”

Section: Introductionmentioning

confidence: 99%

Epitaxial growth of Ce2Y2O7 buffer layers for YBa2Cu3O7−δ coated conductors using reel-to-reel DC reactive sputtering

Feng

Ying

et al. 2011

Physica C: Superconductivity and its Applications

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“…Subsequent YBCO films were deposited by PLD technique on the LZO buffered NiW tapes. The conditions for YBCO deposition as reported previously include a heater temperature of 810°C, a background pressure of 0.3 mbar O 2 , and an oxygen loading step under 400 mbar during cool down [7,15].…”

Section: Methodsmentioning

confidence: 99%

Reel-to-Reel Deposition of Reactively Sputtered LaZrO Buffer Layers on Textured NiW Tapes for YBaCuO Coated Conductors

Feng

Yu-qi

Liu

et al. 2011

J Supercond Nov Magn

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A biaxially textured buffer layer of LaZrO (LZO) was continuously grown on Ni-5-at%W (NiW) tapes using a reel-to-reel DC reactive sputtering technique. X-ray diffraction measurements revealed that the LZO layer deposited at water vapor partial pressures of 2.5×10 −2 Pa and the temperature of 800°C are biaxially textured with the misorientation as low as 4.7°. AFM measurements show that the layer's surfaces are homogeneous and flat with the RMS value less than 5 nm. YBa 2 Cu 3 O 7−δ (YBCO) superconducting films grown on the single LZO buffer layer exhibited the critical temperature (T c ) of 89 K with a narrow transition width less than 2 K. For comparison, another Ce 2 Y 2 O 7 (CYO) layer grown using DC reactive sputtering was added on the top of the LZO layer. The architecture YBCO/CYO/LZO/NiW exhibited better texture and higher T c such as 90 K with T c of 1.5 K, demonstrating the availability of a novel simplified buffer layer stack of CYO/LZO for superconducting coated conductors.

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Deposition of Gd2Zr2O7 single buffer layers with different thickness for YBa2Cu3O7−δ coated conductors on metallic substrates

Cited by 13 publications

References 14 publications

Development of all chemical solution derived Ce_0.9La_0.1O_{2 −y}/Gd₂Zr₂O₇buffer layer stack for coated conductors: influence of the post-annealing process on surface crystallinity

Development of all chemical solution derived Ce_0.9La_0.1O_{2 −y}/Gd₂Zr₂O₇buffer layer stack for coated conductors: influence of the post-annealing process on surface crystallinity

Epitaxial growth of Ce2Y2O7 buffer layers for YBa2Cu3O7−δ coated conductors using reel-to-reel DC reactive sputtering

Reel-to-Reel Deposition of Reactively Sputtered LaZrO Buffer Layers on Textured NiW Tapes for YBaCuO Coated Conductors

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Deposition of Gd2Zr2O7 single buffer layers with different thickness for YBa2Cu3O7−δ coated conductors on metallic substrates

Cited by 13 publications

References 14 publications

Development of all chemical solution derived Ce0.9La0.1O2 −y/Gd2Zr2O7buffer layer stack for coated conductors: influence of the post-annealing process on surface crystallinity

Development of all chemical solution derived Ce0.9La0.1O2 −y/Gd2Zr2O7buffer layer stack for coated conductors: influence of the post-annealing process on surface crystallinity

Epitaxial growth of Ce2Y2O7 buffer layers for YBa2Cu3O7−δ coated conductors using reel-to-reel DC reactive sputtering

Reel-to-Reel Deposition of Reactively Sputtered LaZrO Buffer Layers on Textured NiW Tapes for YBaCuO Coated Conductors

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Development of all chemical solution derived Ce_0.9La_0.1O_{2 −y}/Gd₂Zr₂O₇buffer layer stack for coated conductors: influence of the post-annealing process on surface crystallinity

Development of all chemical solution derived Ce_0.9La_0.1O_{2 −y}/Gd₂Zr₂O₇buffer layer stack for coated conductors: influence of the post-annealing process on surface crystallinity