1981
DOI: 10.1016/0022-3115(82)90770-x
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Depth distribution of 20-keV helium ion irradiation induced cavities in nickel

Abstract: Transmission electron microscopy has been used to study the effect of total dose on the depth distribution of cavities (voids or bubbles) in nickel irradiated at 500°C with 20-keV 4He + ions. A transverse sectioning technique allowed us to obtain the entire depth distribution of cavities from a single specimen. The diameter, number density and volume fraction of cavities were measured as a function of depth from micrographs taken from samples sectioned parallel to the direction of the incident beam. The result… Show more

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Cited by 6 publications
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