2024
DOI: 10.1063/5.0206784
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Depth resolution in piezoresponse force microscopy

Matthias Roeper,
Samuel D. Seddon,
Zeeshan H. Amber
et al.

Abstract: Piezoresponse force microscopy (PFM) is one of the most widespread methods for investigating and visualizing ferroelectric domain structures down to the nanometer length scale. PFM makes use of the direct coupling of the piezoelectric response to the crystal lattice, and hence, it is most often applied to spatially map the three-dimensional (3D) near-surface domain distribution of any polar or ferroic sample. Nonetheless, since most samples investigated by PFM are at least semiconducting or fully insulating, t… Show more

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