2011
DOI: 10.1016/j.eurpolymj.2010.12.007
|View full text |Cite
|
Sign up to set email alerts
|

Depth-resolved molecular structure and orientation of polymer thin films by synchrotron X-ray diffraction

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

3
46
0

Year Published

2011
2011
2020
2020

Publication Types

Select...
7

Relationship

0
7

Authors

Journals

citations
Cited by 40 publications
(49 citation statements)
references
References 39 publications
3
46
0
Order By: Relevance
“…Edge-on orientation of P3HT is favored for: (i) spin coating from solutions in high-boiling solvents, (ii) functionalization of the SiO 2 /Si substrates with self-assembled monolayers of octadecyltrichlorosilane, REVIEW hexamethyldisilazane, or 3-aminopropyltriethoxysilane. 46,53 Face-on orientation is observed for spin coating from solutions in CHCl 3 or deposition of P3HT films by a friction transfer method. 54 Several studies of the P3HT structure by grazing incidence X-ray diffraction in spin-coated films have however demonstrated that crystalline perfection and the preferred edge-on orientation are not uniform in the bulk of the films and depend on the film thickness.…”
Section: Morphology and Structure In Thin Filmsmentioning
confidence: 99%
See 1 more Smart Citation
“…Edge-on orientation of P3HT is favored for: (i) spin coating from solutions in high-boiling solvents, (ii) functionalization of the SiO 2 /Si substrates with self-assembled monolayers of octadecyltrichlorosilane, REVIEW hexamethyldisilazane, or 3-aminopropyltriethoxysilane. 46,53 Face-on orientation is observed for spin coating from solutions in CHCl 3 or deposition of P3HT films by a friction transfer method. 54 Several studies of the P3HT structure by grazing incidence X-ray diffraction in spin-coated films have however demonstrated that crystalline perfection and the preferred edge-on orientation are not uniform in the bulk of the films and depend on the film thickness.…”
Section: Morphology and Structure In Thin Filmsmentioning
confidence: 99%
“…54 Several studies of the P3HT structure by grazing incidence X-ray diffraction in spin-coated films have however demonstrated that crystalline perfection and the preferred edge-on orientation are not uniform in the bulk of the films and depend on the film thickness. 46,53,55,56 For instance, enhanced crystallinity is observed at the air/P3HT film surface. Moreover, the level of preferred orientation is a function of film thickness.…”
Section: Morphology and Structure In Thin Filmsmentioning
confidence: 99%
“…14 Although there exist some important examples of using quantitative XRD to study semicrystalline, semiconducting polymer microstructures, 11,[15][16][17][18][19] Xray analysis in this field is often limited to qualitative observations. Moreover, only a few studies are able to make direct observations about interface structure using XRD.…”
mentioning
confidence: 99%
“…Porzio et al studied the structure of thin polymer films by applying grazing incidence X-ray scattering (GIXS). Diffraction patterns from various film layers could be recorded leading to complementary structural information [37]. Moreover, one of the benefits of this approach was its ability to be used in more complex multilayer films analysis and characterization.…”
Section: Scattering Methodsmentioning
confidence: 99%