2014
DOI: 10.1088/0953-2048/27/5/055025
|View full text |Cite
|
Sign up to set email alerts
|

Depth-resolved transport measurements and atom-probe tomography of heterogeneous, superconducting Ge:Ga films

Abstract: Ge films with a mean Ga content of about 8 and 1 at.% hole concentration can be fabricated by ion implantation and subsequent flash-lamp annealing. The Ge:Ga films become superconducting below critical temperatures in the range between 1 and 2 K depending on the film resistance. The change in the macroscopic transport properties during step-wise surface etching can be described by a homogeneously doped layer model. However, the Ga distribution is extremely heterogeneous on the nanoscale. Atom-probe tomography … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
7
0

Year Published

2015
2015
2024
2024

Publication Types

Select...
6
1
1

Relationship

0
8

Authors

Journals

citations
Cited by 11 publications
(7 citation statements)
references
References 27 publications
0
7
0
Order By: Relevance
“…Figure 4a displays a cross-sectional bright-field TEM image taken from Al-doped Ge after annealing. In this case, both single dislocations within the implanted layer and end-of-range defects are detected [33]. Figure 4b the recrystallized Ge is single-crystalline.…”
Section: Microstructurementioning
confidence: 84%
See 1 more Smart Citation
“…Figure 4a displays a cross-sectional bright-field TEM image taken from Al-doped Ge after annealing. In this case, both single dislocations within the implanted layer and end-of-range defects are detected [33]. Figure 4b the recrystallized Ge is single-crystalline.…”
Section: Microstructurementioning
confidence: 84%
“…Figure 4a displays a cross-sectional bright-field TEM image taken from Al-doped Ge after annealing. In this case, both single dislocations within the implanted layer and end-of-range defects are detected [33]. Figure 4b shows the Ge, Al and O distributions based on EDXS analysis from a representative surface region, as exemplarily marked by the white square in Fig.…”
Section: Microstructurementioning
confidence: 97%
“…The lines show Ga concentration (per cm 3 ) vs. depth for E IMP = 25, 35, 45, and 80 keV all experimentally implemented in this study. The grey line represents Ga distribution for E IMP = 100 keV, serving as a reference to the previous reports on superconducting Ge 16,21,37 .…”
Section: Resultsmentioning
confidence: 99%
“…In light of this, the solubility characteristics of Ga in Ge, depending on the thin film processing techniques, could be higher in thin films than those in bulk. [53][54][55] For example, a single phase homogeneous amorphous GaGe thin film with a Ga composition of 5 at% has been prepared by Nath et al 53 employing physical vapor deposition.…”
Section: Resultsmentioning
confidence: 99%