2013
DOI: 10.1109/jlt.2013.2239606
|View full text |Cite
|
Sign up to set email alerts
|

Design and Analysis for a 850 nm Si Photodiode Using the Body Bias Technique for Low-voltage Operation

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4

Citation Types

0
6
0

Year Published

2014
2014
2023
2023

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 7 publications
(6 citation statements)
references
References 17 publications
0
6
0
Order By: Relevance
“…Several main and important problems should be considered in the study of the silicon-based UV photodiode in the standard CMOS process: (1) the noise and leakage current on the silicon surface [8,9], (2) the spectral response range of the UV photodetector and the penetration depth of UV light into the silicon material [10,11], (3) the fabrication of the ultra-shallow pn junction in the CMOS process [12][13][14], and (4) a decrease in the breakdown voltage or operation voltage of the photodiode for silicon-on-a-chip (SoC) integration [15][16][17]. To optimize the noise performance of the UV photodiode, the processes of doping and isolation need to be improved.…”
Section: Introductionmentioning
confidence: 99%
“…Several main and important problems should be considered in the study of the silicon-based UV photodiode in the standard CMOS process: (1) the noise and leakage current on the silicon surface [8,9], (2) the spectral response range of the UV photodetector and the penetration depth of UV light into the silicon material [10,11], (3) the fabrication of the ultra-shallow pn junction in the CMOS process [12][13][14], and (4) a decrease in the breakdown voltage or operation voltage of the photodiode for silicon-on-a-chip (SoC) integration [15][16][17]. To optimize the noise performance of the UV photodiode, the processes of doping and isolation need to be improved.…”
Section: Introductionmentioning
confidence: 99%
“…[15][16][17][18] On the other hand, the c-Si substrate itself can be used as an active device such as a photodetector in the 0.8 µm wavelength range. [19][20][21][22] A c-Si avalanche photodiode has been fabricated by a 0.18 µm CMOS standard process 23,24) and succeeded in obtaining a bandwidth of more than 7 GHz. 25) However, in this case, c-Si is unsuitable as a material of a waveguide in the 0.8 µm wavelength range 26,27) because of the absorption of Si.…”
Section: Introductionmentioning
confidence: 99%
“…To improve the responsivity and the bandwidth of CMOS PDs, two major approaches have been investigated -spatially modulated PD (SMPD) [3], [6] and avalanche PD (APD) [4], [8]- [11], [13]. SMPD employs differential, symmetrical layout with half of the PD blocked from the light source to cancel out the slow diffusion current in the substrate absorption region.…”
Section: Introductionmentioning
confidence: 99%
“…The lateral alternative has been studied in [11] and [13]. The measured dc responsivity, ac response, modeling formula and received data eye diagram will be presented.…”
Section: Introductionmentioning
confidence: 99%