2004
DOI: 10.1063/1.1786342
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Design and optimization of GaAs∕AlGaAs heterojunction infrared detectors

Abstract: Design, modeling, and optimization principles for GaAs/ AlGaAs heterojunction interfacial workfunction internal photoemission (HEIWIP) infrared detectors for a broad spectral region are presented. Both n-type and p-type detectors with a single emitter or multiemitters, grown on doped and undoped substrates are considered. It is shown that the absorption, and therefore responsivity, can be increased by optimizing the device design. Both the position and the strength of the responsivity peaks can be tailored by … Show more

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Cited by 59 publications
(53 citation statements)
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“…The heterostructure detectors operate based on the internal photoemission process (IPE) process where carriers are photoexcited and escape from one material to another by passing through an absorber/barrier interface [9,12]. The photoemission efficiency is proportional to ( )   -, where is the energy of the photo-excited holes and is the potential energy barrier at the interface.…”
Section: Resultsmentioning
confidence: 99%
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“…The heterostructure detectors operate based on the internal photoemission process (IPE) process where carriers are photoexcited and escape from one material to another by passing through an absorber/barrier interface [9,12]. The photoemission efficiency is proportional to ( )   -, where is the energy of the photo-excited holes and is the potential energy barrier at the interface.…”
Section: Resultsmentioning
confidence: 99%
“…In general, by increasing thickness of p-GaAs absorber, the absorption in material increases which can change the position of the peak responsivity and spectral width of photoresponse up to a certain limit [9,11]. Since, the Al x Ga 1-x As barriers are undoped and will not produce any photo carriers; therefore the thickness differences don"t have any contribution in the extension of threshold wavelength beyond t .…”
Section: (D)mentioning
confidence: 99%
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“…The offset between the Fermi level in the emitter layer and the valence band edge of the barrier layer gives the interfacial workfunction Ä. For HIWIPs, Ä arises due to the band gap narrowing of a highly doped emitter layer [21], while for HEIWIP, the band offset of different materials [22] also contributes to Ä. The threshold wavelength ë c (in µm) is calculated by 1240/Ä, where Ä is in meV.…”
Section: Interfacial Workfunction Detectorsmentioning
confidence: 99%
“…Both HIWIP and HEIWIP detectors [21,22] were studied as FIR detectors. Here, the focus will be on dual band detection.…”
Section: Interfacial Workfunction Detectorsmentioning
confidence: 99%