2007
DOI: 10.1007/bf02919454
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Design and test of an electronic nose for monitoring the air quality in the international space station

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Cited by 16 publications
(13 citation statements)
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“…At the same time, penthanol cannot be practically recognized. Thus, after the performed experiments one can draw the following conclusions: i) thermally deposited calixarene C [4]Re, С [8]А and С [6]А films demonstrate different sensitivity when adsorbing ethanol, isopropanol and penthanol molecules; ii) С[4]А films do not pronounce any noticeable sensitivity to the studied analytes, therefore the respective curves were not presented in this paper; iii) even using two films -C [4]Re and С[8]А -one can distinguish ethanol and isopropanol as well as determine their concentration.…”
Section: Spr Investigations Of Calixarene Filmsmentioning
confidence: 88%
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“…At the same time, penthanol cannot be practically recognized. Thus, after the performed experiments one can draw the following conclusions: i) thermally deposited calixarene C [4]Re, С [8]А and С [6]А films demonstrate different sensitivity when adsorbing ethanol, isopropanol and penthanol molecules; ii) С[4]А films do not pronounce any noticeable sensitivity to the studied analytes, therefore the respective curves were not presented in this paper; iii) even using two films -C [4]Re and С[8]А -one can distinguish ethanol and isopropanol as well as determine their concentration.…”
Section: Spr Investigations Of Calixarene Filmsmentioning
confidence: 88%
“…In this work, as sensitive materials of a multisensor array we investigated thin calixarene films: tretbutyl-calix [4,6,8] The thickness of the order of 100 nm was chosen as optimal, because this calixarene film thickness provides the shift of the SPR angle to the range 55 -60°, which is suitable to the chosen prism dimensions. Since this class of calixarene films is thermally stable, the films were deposited using thermal evaporation in vacuum without heating the substrate (ВУП-4 facility, residual vapor pressure 4⋅10 -4 Pa, speed of sputtering 1 nm/s).…”
Section: Sensitive Materialsmentioning
confidence: 99%
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