Design-For-Safety For Automotive IC Design: Challenges And Opportunities

Nardi, A.; Camdzic, Samir; Armato, Antonino; Lertora, F.

doi:10.1109/cicc.2019.8780332

Cited by 14 publications

(3 citation statements)

References 6 publications

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“…Soft and hard defects are the two types of defects that can happen in analog circuits. Figure 7 proposes the locations of possible analog defects of a transistor-level description of an inverter circuit [1]. For transistor-level models, there is a broad agreement in the industry on the common hard defects in analog device-level models 1 : transistor, resistors, capacitors, and interconnections.…”

Section: A Analog Defect Modelsmentioning

confidence: 99%

“…N OWADAYS, with the increase in the complexity of analog and mixed-signal circuits, guaranteeing the functional safety of both digital and analog circuits is fundamental to reducing every risk of failure in Cyber-Physical System (CPS) and Industrial Cyber-Physical System (ICPS) [1]. Building efficient analog defect injection and simulation techniques became strategic for manufacturers [2].…”

Section: Introductionmentioning

confidence: 99%

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Analog Defect Injection and Fault Simulation Techniques: A Systematic Literature Review

Azam

Dall'Ora

Fraccaroli

et al. 2024

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

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Since the last century, the exponential growth of the semiconductor industry has led to the creation of tiny and complex integrated circuits, e.g., sensors, actuators, and smart power. Innovative techniques are needed to ensure the correct functionality of analog devices that are ubiquitous in every smart system. The ISO 26262 standard for functional safety in the automotive context specifies that fault injection is necessary to validate all electronic devices. For decades, standardization of defect modeling and injection mainly focused on digital circuits and, in a minor part, on analog ones. An initial attempt is being made with the IEEE P2427 draft standard that started to give a structured and formal organization to the analog testing field.Various methods have been proposed in the literature to speed up the fault simulation of the defect universe for an analog circuit. A more limited number of papers seek to reduce the overall simulation time by reducing the number of defects to be simulated. This literature survey describes the state-of-the-art of analog defect injection and fault simulation methods. The survey is based on the Preferred Reporting Items for Systematic Reviews and Meta-Analyses (PRISMA) methodological flow, allowing for a systematic and complete literature survey. Each selected paper has been categorized and presented to provide an overview of all the available approaches. In addition, the limitations of the various approaches are discussed by showing possible future directions.

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Section: A Analog Defect Modelsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Analog Defect Injection and Fault Simulation Techniques: A Systematic Literature Review

Azam

Dall'Ora

Fraccaroli

et al. 2024

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

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“…Description: SMs can be improperly implemented by inhouse designers as a result of systematic faults. Usually, SMs are implemented manually (hard coded in RTL) or semiautomatically (script-based), which requires lengthy and tedious verification and is prone to errors, especially for complex IC designs [172]. For example, a required but tedious safety verification step when implementing SMs is to ensure Freedom from Interference (FFI) of redundant blocks.…”

Section: Improper Implementation or Missing Safety Mechanismsmentioning

confidence: 99%

Trustworthy Integrated Circuits: From Safety to Security and Beyond

Rama,

Ayache,

Buchty

et al. 2024

IEEE Access

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The trustworthiness of integrated circuits (ICs) has become increasingly important due to the ubiquitousness of ICs and the insecure nature of the current semiconductor supply chain. Throughout development and operation, ICs are exposed to several risks that can arise from malicious actors or harsh operational conditions. Therefore, the question arises: Does the trustworthiness of an IC indicate its security only or other attributes beyond? Various disciplines may have a different understanding of what IC trustworthiness means. Thus, a compact and unified definition that provides its main overarching attributes is required. Such a definition would lead to a greater readiness to deal with emerging challenges. To define trustworthiness at IC level, we identify the minimum number of attributes required to cover the various perspectives of development, focusing on correct functionality, reliability, security, and functional safety. Subsequently, we review and provide a structured description of identified critical pre-silicion issues that can negatively impact the defined attributes. Besides academic literature, standards, and industry-relevant publications, we consider industry experts' opinions to achieve the maximum possible coverage of our topical review. We also provide an overview and analysis of several existing evaluation methodologies of the respective trustworthiness attributes, as evaluating the discussed issues is another important aspect for achieving trustworthiness. Our findings highlight the need for a comprehensive and universally applicable framework to evaluate the trustworthiness of ICs.

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