Design of a 0.9 V 2.45 GHz Self-Testable and Reliability-Enhanced CMOS LNA

Cimino, M.; Lapuyade, Hervé; Deval, Yann; Taris, Thierry; Bégueret, Jean-Baptiste

doi:10.1109/jssc.2008.920354

Cited by 48 publications

(33 citation statements)

References 19 publications

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“…From these facts, we may conclude that solutions proposed at [4], with a redundant transistor core, and [5], adjusting CS-MOS characteristics through adaptive substrate bias, without concerning matching networks, do not offer a way to compensate the LNA deviations under process variations. By the other hand, using a low Q output inductor to mitigate this situation [6], is not effective either.…”

Section: A Deviations In Resonant Frequencymentioning

confidence: 99%

“…Among its weak point is its sensitivity to process variations. In these terms, techniques trying to overcome transistor's deviation and reliability in CMOS LNAs have paid the attention of some recent works [4,5]. But these works attend transistors only, while forget passive elements effects.…”

Section: Introductionmentioning

confidence: 99%

“…Table I shows the LNA's specifications for a Zigbee@2. 4 GHz application. Table II shows the device's size for a 90 nm CMOS design (@50Ω input and output matching) accomplishing the performance described in Table III …”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Analysis of process variations' impact on a 2.4 GHz 90 nm CMOS LNA

González

Cruz

Vazquez

et al. 2013

2013 IEEE 4th Latin American Symposium on Circuits and Systems (LASCAS)

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Section: A Deviations In Resonant Frequencymentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Analysis of process variations' impact on a 2.4 GHz 90 nm CMOS LNA

González

Cruz

Vazquez

et al. 2013

2013 IEEE 4th Latin American Symposium on Circuits and Systems (LASCAS)

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“…As a matter of consequence, selecting the proper samples at the SASP output allows RF channel selection on demand -it also depends on the SASP resolution. Doing so, Low Noise Amplifier (LNA) located before the SASP is no longer required to be narrow band [4], but is expected wideband instead. Consequently, the SASP can handle any signal falling within the LNA bandwidth.…”

Section: B Full Software Radio Receiversmentioning

confidence: 99%

Full Software Radio transceivers

Deval

Rivet

Veyrac³

et al. 2013

2013 IEEE 10th International Conference on ASIC

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This paper presents the current status and trends in research on Full Software Radio (FSR). Concerning the receiver path after defining Software Defined Radio (SDR) versus FSR a new version of the Sampled Analog Signal Processor (SASP) is presented and experimental results are discussed. The new version doubles the signal bandwidth while the power consumption is reduced to less than 100 mW. For the transmitter path, a new FSR architecture is presented based on Riemann's algorithm and a charge pump. A GaN demonstrator of the Riemann's Pump is presented, which generates any signal including concurrent emissions in the 0-to-1 GHz band.

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“…The most popular built-in test approach for RF transceivers is the loop-back test where the test signals are generated in the baseband and the transmitter's output is switched to the receiver's input to analyse the test response also in the baseband [12,19,28,31]. Another popular builtin test technique relies on the use of envelope detectors [6,7,18,29,32] and current sensors [11,15] to extract DC/low-frequency test signatures that nevertheless carry RF information. Finally, alternate test is a generic technique that aims to map low-cost measurements to the RF performances [13,16,25,30], thus circumventing the need to measure directly the RF performances.…”

Section: Introductionmentioning

confidence: 99%

Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors

et al. 2015

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International audienceTesting the RF functions of systems-on-chip incurs a very high cost. Built-in test is a promising alternative to facilitate testing and reduce cost. However, designing built-in test circuits that tap into the sensitive RF signal paths, in order to extract useful information for the purpose of testing, often finds the designers reluctant since it results in some performance degradation that needs to be accounted for during the design. In this paper, we study a transparent built-in test approach based on non-intrusive sensors that are not electrically connected to the RF circuit under test. The non-intrusive sensors simply monitor process variations and by virtue of this they are capable of tracking variations in the performances of the RF circuit as well. The alternate test paradigm is employed to map the outputs of the sensors to the performances, in order to replace the standard tests for measuring the performances directly. We discuss in this paper the principle of operation of these sensors and we demonstrate the non-intrusive test approach on a 65nm RF low noise amplifier

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Design of a 0.9 V 2.45 GHz Self-Testable and Reliability-Enhanced CMOS LNA

Cited by 48 publications

References 19 publications

Analysis of process variations' impact on a 2.4 GHz 90 nm CMOS LNA

Analysis of process variations' impact on a 2.4 GHz 90 nm CMOS LNA

Full Software Radio transceivers

Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors

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