“…Relevant commercial interferometers produced by Renishaw, Keysight and JENAer are mostly used for single parameter measurement. With the increasing requirements for measurement efficiency, multiparameter simultaneous measurement systems based on the principle of laser collimation [ 7 , 8 , 9 , 10 ] or the combination of collimation and interference [ 11 , 12 , 13 , 14 , 15 , 16 , 17 , 18 ] continue to emerge, and have become the current research trend. Although, multiparameter simultaneous measurement systems have improved efficiency compared to single-parameter measurement systems, in actual measurement, it is often necessary to adjust the installation positions of the measurement head and the target mirror according to the machine tool types.…”