Design of Totally Self-Checking Check Circuits for M-out of-N Codes

Anderson, Deborah; Metze, Gernot

doi:10.1109/ftcsh.1995.532641

Cited by 32 publications

(54 citation statements)

References 3 publications

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“…Implementation costs of multiple error codes in the range of four to eight bits has been found to rise rapidly. Even for the so-called unidirectional faults 4 , the implementation costs increase significantl and the computational delays increase with increasing word length.…”

Section: Appendix I Definition Of Baseline Processing Requirementsmentioning

confidence: 99%

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Self-Diagnosing Design Techniques.

Heckelman¹,

Knight²,

Straub³

1978

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Section: Appendix I Definition Of Baseline Processing Requirementsmentioning

confidence: 99%

“…Constant weight and unordered codes have been suggested (2,3) for the design of totally self-checking circuits. These codes are used because the structure of the functional blocks and the assumed faults always lead to unidirectional errors (4). Unordered codes have the property that they can detect any unidirectional error.…”

Section: Interface Module Designmentioning

confidence: 99%

Self-Diagnosing Design Techniques.

Heckelman¹,

Knight²,

Straub³

1978

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“…To guarantee system high reliability, similarly to checkers of selfchecking circuits (SCCs) [18], our monitor should check itself with respect to internal faults, and satisfy either the Totally Self-Checking (TSC) [18], or the Strongly Code-Disjoint (SCD) [20] property with respect to such faults. As usual with SCCs, we assume that faults occur one at a time, and that the time elapsing between two following faults is long enough to allow the application of all possible input codewords (i.e., the correct Vout value) [18].…”

Section: Self-checking Abilitymentioning

confidence: 99%

Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection

Omaña

Rossi

Giaffreda

et al. 2013

IEEE Trans. VLSI Syst.

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“…The following definitions can be used to describe a Totally Self-Checking (TSC) system [9][10][11][12].…”

Section: Totally Self-checking Property Of Sedc Circuitsmentioning

confidence: 99%

Self-Checking Look-up Tables using Scalable Error Detection Coding (SEDC) Scheme

Lee¹,

Siddiqui

Somasundaram³

et al. 2013

JSTS:Journal of Semiconductor Technology and Science

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Abstract-In this paper, we present Self-Checking look-up-table (LUT) based on Scalable Error Detection Coding (SEDC) scheme for use in faulttolerant reconfigurable architectures. SEDC scheme has shorter latency than any other existing coding schemes for all unidirectional error detection and the LUT execution time remains unaffected with selfchecking capabilities. SEDC scheme partitions the contents of LUT into combinations of 1-, 2-, 3-and 4-bit segments and generates corresponding check codes in parallel. We show that the proposed LUT with SEDC performs better than LUT with traditional Berger as well as Partitioned Berger Coding schemes. For 32-bit data, LUT with SEDC takes 39% less area and 6.6 times faster for selfchecking than LUT with traditional Berger Coding scheme.

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Design of Totally Self-Checking Check Circuits for M-out of-N Codes

Cited by 32 publications

References 3 publications

Self-Diagnosing Design Techniques.

Self-Diagnosing Design Techniques.

Faults Affecting Energy-Harvesting Circuits of Self-Powered Wireless Sensors and Their Possible Concurrent Detection

Self-Checking Look-up Tables using Scalable Error Detection Coding (SEDC) Scheme

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