“…While XPS has demonstrated some utility in the analysis of MOFs, it has yet to be used to explicitly study the PSE process. XPS studies of MOFs to date include its use in the identification of surface species, modifications and adsorbates, ,, and the presence of metal particles, , metal SBUs, and their related oxidation states at the surfaces of MOF films and particles. , With the judicious employment of controls, XPS can be a powerful tool for revealing the relative linker distribution from the particle surface to the interior, even for particles on the nanometer scale, and can uncover chemical differences in PSE and direct synthesis products.…”