2016
DOI: 10.1016/j.orgel.2016.06.011
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Determination of crystal orientation in organic thin films using optical microscopy

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Cited by 19 publications
(27 citation statements)
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“…For an isolated para-phenylene molecule, its polarization is parallel to the long molecule axis. 43,44 Since the molecule orientation also determines the optical indicatrix and polarization properties of fibers and wings, 33,52 a spatially resolved polarization analysis reveals the projection of the long molecule axis onto the substrate surface. From the orientation of the long fiber or wing axis, y orient , the angle of the long molecule axis with respect to the long aggregate axis is calculated, b mol = f pol À y orient .…”
Section: Resultsmentioning
confidence: 99%
“…For an isolated para-phenylene molecule, its polarization is parallel to the long molecule axis. 43,44 Since the molecule orientation also determines the optical indicatrix and polarization properties of fibers and wings, 33,52 a spatially resolved polarization analysis reveals the projection of the long molecule axis onto the substrate surface. From the orientation of the long fiber or wing axis, y orient , the angle of the long molecule axis with respect to the long aggregate axis is calculated, b mol = f pol À y orient .…”
Section: Resultsmentioning
confidence: 99%
“…DIC is an optical technique that can probe optical anisotropy of thin films. 17 As shown in Fig. 2c, fast and slow axes n 1 , n 2 obtained from the DIC signal correspond to the crystallographic axes b and a, respectively.…”
mentioning
confidence: 88%
“…The most promising methods such as meniscus‐guided coating techniques or thermal gradient annealing, all employ a unidirectional solidification approach that separates nucleation and subsequent growth. Even though these techniques yield thin films with large single crystalline regions, these layers exhibit many morphological defects such as cracks, voids, or parallel ribbon growth that affect the film over multiple length scales. Such defects lower the electrical performance and are a major cause for spread in transport characteristics.…”
mentioning
confidence: 99%
“…We distinguish three main types of defects that can be formed during unidirectional crystallization. First, cracks in the semiconductor film are often caused by thermal contraction or a phase change when the film cools down after processing above room temperature. Second, in meniscus‐guided coating techniques, a stick–slip motion of the meniscus gives rise to defect patterns parallel to the receding contact line .…”
mentioning
confidence: 99%
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