2017
DOI: 10.1002/adma.201703864
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Highly Crystalline C8‐BTBT Thin‐Film Transistors by Lateral Homo‐Epitaxial Growth on Printed Templates

Abstract: Highly crystalline thin films of organic semiconductors offer great potential for fundamental material studies as well as for realizing high-performance, low-cost flexible electronics. The fabrication of these films directly on inert substrates is typically done by meniscus-guided coating techniques. The resulting layers show morphological defects that hinder charge transport and induce large device-to-device variability. Here, a double-step method for organic semiconductor layers combining a solution-processe… Show more

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Cited by 79 publications
(88 citation statements)
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“…[4] Therefore, in order to assess the intrinsic mobility in films that use our optimized morphology, we additionally discuss devices with gold electrodes. [4] Therefore, in order to assess the intrinsic mobility in films that use our optimized morphology, we additionally discuss devices with gold electrodes.…”
Section: Devices With Au Source and Drain Electrodesmentioning
confidence: 99%
See 3 more Smart Citations
“…[4] Therefore, in order to assess the intrinsic mobility in films that use our optimized morphology, we additionally discuss devices with gold electrodes. [4] Therefore, in order to assess the intrinsic mobility in films that use our optimized morphology, we additionally discuss devices with gold electrodes.…”
Section: Devices With Au Source and Drain Electrodesmentioning
confidence: 99%
“…In the study that focused on the application of a UV-ozone treatment for the enhancement of the dielectric-semiconductor interface, effective mobilities as high as 6.5 cm 2 V −1 s −1 were achieved. [4] In the latter publication, the authors address the currently widely discussed issue of mobility overestimation. [24] Moreover, peak values of 9.1 cm 2 V −1 s −1 were reported for the same blend after recrystallization via solvent-vapor-annealing (SVA).…”
Section: Introductionmentioning
confidence: 99%
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“…[6] To ensure good electrical characteristics, [43,44] the samples were annealed in a N 2 -filled glove box at a temperature of 50 °C for 10 h. Electrical characterizations were done using an Agilent Agt1500 in dry air. The transistor channel length and width was 190 and 2035 μm, respectively and the channel length was aligned with the casting direction so that the zone-cast ribbons tend to form bridges between the source and drain contacts.…”
Section: Wwwadvmatinterfacesdementioning
confidence: 99%