1992
DOI: 10.1016/0040-6090(92)90814-r
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Determination of electrical and optical parameters of Ga1−xInxAsySb1−y and Ga1−xAlxAsySb1−y thin layers grown on GaSb substrates by IR reflectivity

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Cited by 9 publications
(6 citation statements)
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“…The IR reflectivity spectra for Ga x In 1Àx As y Sb 1Ày /GaSb epilayers have been measured by Mezerreg et al [161] and Pickering [168]. The reststrahlen parameters obtained were presented in tabular form [161].…”
Section: (D) Gainassbmentioning
confidence: 99%
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“…The IR reflectivity spectra for Ga x In 1Àx As y Sb 1Ày /GaSb epilayers have been measured by Mezerreg et al [161] and Pickering [168]. The reststrahlen parameters obtained were presented in tabular form [161].…”
Section: (D) Gainassbmentioning
confidence: 99%
“…The reststrahlen parameters obtained were presented in tabular form [161]. Studies on Ga x In 1Àx As y Sb 1Ày /InAs have also been undertaken by Pickering [168].…”
Section: (D) Gainassbmentioning
confidence: 99%
“…These materials exhibit a wide band gap, ranging from infrared (IR) to visible light, which is useful for applications in thermo-photovoltaic [3], optoelectronics [4] and high-speed devices [5]. Several works have been focused on the elaboration of binary, ternary and especially quaternary alloy epitaxial layers and then on the investigation of their optical and physico-electrical properties [6]. In A 1−x B x C y D 1−y alloys, the two compositions x and y can be modulated and each set of values (x, y) corresponds to an operating wavelength of a particular device [6].…”
Section: Introductionmentioning
confidence: 99%
“…Several works have been focused on the elaboration of binary, ternary and especially quaternary alloy epitaxial layers and then on the investigation of their optical and physico-electrical properties [6]. In A 1−x B x C y D 1−y alloys, the two compositions x and y can be modulated and each set of values (x, y) corresponds to an operating wavelength of a particular device [6]. The 3 Author to whom any correspondence should be addressed.…”
Section: Introductionmentioning
confidence: 99%
“…G a l -,In,As, -$by quaternary alloys matched on GaSb substrate are grown by the conventional liquid phase epitaxy (LPE) [4] technique. IR reflectivity measurements have been already made on these quaternary alloys to determine other electrical and optical parameters by Mezerreg et al [5]. Photodetector devices used in this work are Gal -,In,Sb,/Ga, -,In,Sb, homojunctions grown onto GaSb, substrate, Gal _,In,Sb,/GaSb, ternary heterojunction, and GaSbdGa, -,In,As -,Sb,,/GaSb, quaternary heterojunction.…”
Section: Introductionmentioning
confidence: 99%