1987
DOI: 10.1063/1.339780
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Determination of electrical transport properties using a novel magnetic field-dependent Hall technique

Abstract: A novel technique is presented for interpreting magnetic field-dependent Hall data at magnetic fields below the range at which Shubnikov–de Haas oscillations occur. The technique generates a ‘‘mobility spectrum’’ in which the maximum carrier density or maximum conductivity is determined as a continuous function of mobility. Examples of the use of the technique with synthetic data as well as data from HgCdTe and GaAs/AlGaAs samples are provided. Other uses of the procedure, including measurement of Fermi surfac… Show more

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Cited by 247 publications
(123 citation statements)
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“…In Table 1 we present the results of the transport mobility measurements which where obtained from the classical part of the magneto-resistance measurements by the analysis method of Beck and Anderson [2]. Their analysis method could only be used in the low-doping concentration regime because we were not able to obtain reproducible results when three or more subbands are populated.…”
Section: Resultsmentioning
confidence: 99%
“…In Table 1 we present the results of the transport mobility measurements which where obtained from the classical part of the magneto-resistance measurements by the analysis method of Beck and Anderson [2]. Their analysis method could only be used in the low-doping concentration regime because we were not able to obtain reproducible results when three or more subbands are populated.…”
Section: Resultsmentioning
confidence: 99%
“…5(a)]. Furthermore, the temperature dependence of the mobility of the n-Ge channel μ n-Ge was determined using maximum-entropy mobility spectrum analysis [60,61]. The mobility in the n-Ge channel changed from 210 AE 30 cm 2 V −1 s −1 at RT to 376 AE 30 cm 2 V −1 s −1 at 130 K [see Fig.…”
Section: H Y S I C a L R E V I E W L E T T E R Smentioning
confidence: 99%
“…With the QMSA method, one can easily extract the mobilities and densities of individual electron and holes in bulk semiconductor materials and heterostructures [25,26]. This method is shown to be superior to other methods such as the two-carrier fit, multi carrier fit, and mobility spectrum analysis methods [27][28][29][30]. The analysis details are listed in our previous work for AlGaN/GaN based systems [31].…”
Section: Resultsmentioning
confidence: 99%