Determination of low atomic number elements by X-ray fluorescence fundamental parameter method

Atomic spectrometry update–X-ray fluorescence spectrometry

“…Fundamental parameter (FP) methods were extended to the analysis of Z < 10 elements and in situ excitation geometry by Pavlinskii and Vladimirova. 61 They demonstrated that the ionisation of elements such as carbon and oxygen by photo-and Auger-electrons should be taken into account in the FP models when relevant. Pavlinskii et al 62 published another article on the contribution of the photoelectric effect, Auger-and Comptongenerated electrons to the bremsstrahlung radiation produced in the sample during irradiation by X-rays.…”

Mass Spectrometry‐based Techniques for Direct Quantification of High Ionization Energy Elements in Solid Materials—challenges and Perspectives

“…However, primary X‐ray techniques, such as X‐ray fluorescence—XRF, energy dispersive X‐ray scanning electron microscopy (EDX SEM), electron probe microanalysis, etc. (Pavlinskii & Vladimirova, 2009; Watkins et al, 2017) have relatively high limits of detection (LoDs) for light elements such as N, O, and F, which are mostly related to the high matrix effects (Pavlinskii & Vladimirova, 2009; An et al, 2012; Boča, Gurišová, & Šimko, 2017; Watkins et al, 2017). Energy‐dispersive X‐ray spectroscopy and electron energy‐loss spectroscopy and transmission electron microscopy are unapplicable for the elemental levels below 0.1 at.% (Eswara et al, 2019).…”

X-ray Spectrometry

“…Thus, for carbon with the primary radiation of X-ray tubes, this contribution can be as high as 60−80% of the total fluorescence intensity. Pavlinskii and Vladimirova performed FP-based XRF analysis of materials containing low- Z elements (fluorine, oxygen, nitrogen, carbon, and boron). It was shown by the examples of carbon and oxygen that the account of C and O atom ionization by photo- and Auger electrons of the irradiated sample was obligatory.…”