Determination of the effective atomic numbers of Fe$_{x}$Cu$_{1-x} $binary ferroalloys using a nondestructive technique: Rayleigh-to-Compton scattering ratio

Büyükyıldız, Mehmet

doi:10.3906/fiz-1603-25

Cited by 6 publications

(2 citation statements)

References 25 publications

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“…In [16], Zeff values for alloys were determined by interpolating the Zeff dependence using data for neighboring elements. In [17], a practical method for identifying binary oxides by the dependence on Zeff was proposed using a priori information about one of the elements, oxygen.…”

Section: Study Of Multicomponent Materialsmentioning

confidence: 99%

Application of the Compton Effect to Solve Problems of Condensed Matter Physics

Mikhailov¹,

Baturin²,

Mikhailov³

et al. 2022

J. Nano- Electron. Phys.

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The prospects for the application of X-ray spectral methods and scattering phenomena as a basis for chemical and phase analysis in new areas are considered. It is theoretically shown that the sensitivity of the scattering method does not depend on the structure and quality of the sample surface and increases sharply with a decrease in the atomic number of the analyzed impurity. The sensitivity of the method is analyzed in the study of multicomponent standards of stoichiometric composition based on H, Li, B, C, O and F, and compared with the sensitivity of traditional analytical methods. The concentration sensitivity of detecting the content of light impurities in metals is calculated and experimental confirmation is given for titanium-hydrogen and iron-carbon systems. For the first time, the Compton method is generalized for the analysis of multicomponent systems of unknown composition. To do this, using the Duvauchelle approach, the concept of the effective atomic number by the scattering property is introduced. It is shown that the dependence of the effective atomic number on the parameter x, which reflects the measurement conditions (scattering angle and primary radiation wavelength), uniquely determines a multicomponent compound. Based on the sensitivity analysis, the range of application of the scattering method is substantiated. From the side of small values of the parameter x, the method is limited due to Bragg reflections superimposed on the Rayleigh peak. For large values of the parameter x, the sensitivity of the method decreases due to the large discrepancy between the intensities of coherent and incoherent scattering. The examples of solving analytical problems are given, in which the use of X-ray fluorescence and diffraction analysis is either very difficult or impossible at all.

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Section: Study Of Multicomponent Materialsmentioning

confidence: 99%

Application of the Compton Effect to Solve Problems of Condensed Matter Physics

Mikhailov¹,

Baturin²,

Mikhailov³

et al. 2022

J. Nano- Electron. Phys.

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“…** In Icelli the identification of binary oxides was carried out from the dependence of

\frac{true}{I_{R}}

on Zeff using a priori information about one of the elements – oxygen. The Zeff values of alloys are determined by interpolating this dependence for the material using the data of adjacent elements in between the dependences of the alloys . But one cannot solve the reciprocal task of determining the atomic numbers of elements and their concentration in multicomponent samples based on the number of Zeff only.…”

Section: Introductionmentioning

confidence: 99%

Determination of binary systems based on light elements by the ratio of the Compton and Rayleigh scattering intensities

Mikhailov¹,

Baturin

Mikhaǐlov

et al. 2020

X-Ray Spectrometry

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A generalization of the Compton method for determining elements with a low atomic number Z from 1 (H) to 9 (F) by the ratio trueICIR of the intensities of incoherent (Compton) and coherent (Rayleigh) scattering is proposed. The generalization takes into account not only the dependence of this ratio on the effective atomic number of the scatterer material but also the momentum transfer variable x = sin0.5emθλ. The new method is based on the application of calibration function of trueICIR=g()Z,x obtained by measuring scattering spectra at two values of x1= 0.831 Å−1 and x2= 1.297 Å−1 with a WDXRF spectrometer. The elemental atomic numbers and their concentrations of binary compounds with unknown compositions are determined by the solution of a system of linear equations. Coefficients of the equations are calculated from the measured trueICIR ratios for the test sample and the regularization solution for the corresponding calibration. The experiments have been carried out for standard samples of single‐component, binary and triple stoichiometric compounds based on H, Li, Be, B, C, O and F. The identification of these elements was found to be possible in the absence of a relationship between the positions of scattering peaks and the composition of the sample, and a qualitative and quantitative analysis of the composition of the material was carried out as part of the solution of a single inverse problem.

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