Determination of the electron inelastic mean free path in polyacetylene by elastic peak electron spectroscopy using different spectrometers

Lesiak, B.; Kosinski, Andrzej S.; Krawczyk, M.; Zommer, L.; Jabłoński, A.; Zemek, J.; Jiřı́ček, P.; Kövér, L.; Tóth, J.; Varga, D.; Cserny, I.

doi:10.1016/s0169-4332(98)00790-9

Cited by 16 publications

(35 citation statements)

References 14 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The helium pycnometry densities for polythiophenes reported elsewhere [10] are similar (around 1 g cm −3 [10]). For undoped and metal doped polymers the density values vary between 0.9 g cm −3 and 1.6 g cm −3 [6][7][8][9][10]. Comparison of polythiophenes nominal and XPS composition indicates contamination of Cl, Si, Na, and O, resulting from the synthesis environment.…”

Section: Discussionmentioning

confidence: 99%

“…The helium pycnometry method for bulk density determination in porous materials, described in detail by Presz et al [33], was previously applied for determining the bulk density of conductive polymers [6][7][8][9] and investigated polythiophenes (Ref. [10], Table 1).…”

Section: Methodsmentioning

confidence: 99%

“…For determining the IMFPs in polymers, the predictive formulae such as the TPP-2M formula of Tanuma et al [3], the G1 formula of Gries [4] and the quantitative structure-property relationship proposed by Cumpson [5] can be used. The IMFPs obtained from the EPES method have been published for selected conductive polymers, such as polyacetylenes, Pd doped polyacetylenes [6,7], polyanilines [8,9], and polythiophenes [10]. Discrepancies between measured [6][7][8][9][10] and predicted IMFPs [3,4] have been observed.…”

Section: Introductionmentioning

confidence: 99%

“…The IMFPs obtained from the EPES method have been published for selected conductive polymers, such as polyacetylenes, Pd doped polyacetylenes [6,7], polyanilines [8,9], and polythiophenes [10]. Discrepancies between measured [6][7][8][9][10] and predicted IMFPs [3,4] have been observed. Part of the deviations can be ascribed to some problems in determination of IMFPs in polymers by the EPES method.…”

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

Influence of Recoil Effect and Surface Excitations on the Inelastic Mean Free Paths of Electrons in Polymers

et al. 2006

View full text Add to dashboard Cite

In this work, the influence of recoil effect and surface excitations on the inelastic mean free paths for polythiophenes is investigated. The inelastic mean free paths of electrons in polythiophenes are measured with the elastic peak electron spectroscopy method using the Ag standard and the electron elastic scattering cross-sections from the database NIST 3.1 in the electron kinetic energy range 200-5000 eV. The Monte Carlo model is applied for evaluating the electron backscattering intensities from the polymers and the Ag standard, as well as for evaluating electrons quasi-elastically backscattered from atoms of different atomic numbers (the recoil effect). The surface excitation corrections are accounted for using the formalism of Chen, with the material parameters for polythiophenes evaluated from the elastic peak electron spectroscopy method. Deviations due to recoil effect and surface excitations to the inelastic mean free paths are compared and discussed. Correction to the inelastic mean free paths due to recoil effect is considerable but is smaller, however, than the correction due to surface excitations. Accounting for recoil effect and surface excitations leads to improvement of the inelastic mean free paths, as compared to the inelastic mean free paths resulting from the predictive formulae of Gries.

show abstract

Section: Discussionmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Influence of Recoil Effect and Surface Excitations on the Inelastic Mean Free Paths of Electrons in Polymers

et al. 2006

View full text Add to dashboard Cite

show abstract

“…elemental solids, 8 -12 binary compounds 11 and multicomponent organic samples. 13 The factors contributing to the statistical and systematic errors in IMFP values obtained with the EPES method include: the accuracy of the backscattered intensity measurements; the accuracy of the model used to describe the electron transport; the cross-sections for elastic scattering; and input parameters to the Monte Carlo algorithm, such as surface composition, density of the investigated samples and the IMFP value for the standard * Correspondence to: B. Lesiak 14 The best consistency between calculated IMFPs and measured IMFPs was observed for Ni, Cu, Ag and Au.…”

Section: Introductionmentioning

confidence: 99%

Inelastic mean free path measurements of electrons near nickel surfaces

Lesiak

Jabłoński

Zemek

et al. 2000

Surf. Interface Anal.

View full text Add to dashboard Cite

The inelastic mean free path of electrons near solid surfaces is a key parameter in quantitative analyses by commonly used surface-sensitive methods. There are experimental and theoretical methods to determine reliable inelastic mean free path values. The elastic peak electron spectroscopy method allows the determination of the inelastic mean free path values in agreement with the ASTM definition. This method is based on a theoretical relationship between elastic backscattering probability and the inelastic mean free path.In the present contribution, we study statistical and systematic uncertainties of the measured backscattered intensities from Ni foils prepared by rolling and cutting of the bulk material and of annealing. Depending on the sample preparation, the measured intensities vary by a factor of 2 for 200 eV electron energy, whereas at >1000 eV the deviations are much smaller. This behaviour, explained by the different surface morphology and different grain sizes, has an important impact on measured inelastic mean free path values. Investigation of Ni foils is of a great interest due to frequent use of this metal as a standard material in the elastic peak electron spectroscopy method.

show abstract

Determination of the inelastic mean free path of electrons in polyaniline samples by elastic peak electron spectroscopy

Lesiak

Kosinski

Jabłoński

et al. 2000

Surf. Interface Anal.

View full text Add to dashboard Cite

Application of x‐ray photoelectron spectroscopy, Auger electron spectroscopy and electron energy loss spectroscopy for quantitative characterisation of surfaces requires knowledge of the electron inelastic mean free path and its energy dependence. Inelastic mean free path values have been determined for a wide variety of solids using theoretical and experimental methods. However, the number of published inelastic mean free path values for polymers is limited. In principle, these values for polymers can be estimated using predictive formulae such as TPP‐2M and the G1 formula of Gries. An alternative method for inelastic mean free path determination in polymers is elastic peak electron spectroscopy. In the present work, the surface chemical composition of polyaniline samples (undoped and doped with palladium) was analysed quantitatively using x‐ray photoelectron spectroscopy. The inelastic mean free path values were determined by elastic peak electron spectroscopy using a high‐energy‐resolution hemispherical analyser in the energy range 500– 5000 eV. The resulting inelastic mean free path values evaluated using Ni and Ag standards are smaller than the values resulting from the G1 predictive formula of Gries and the TPP‐2M predictive formula of Tanuma et al. The discrepancies in the inelastic mean free path values are discussed extensively. Copyright © 2000 John Wiley & Sons, Ltd.

show abstract

Determination of the electron inelastic mean free path in polyacetylene by elastic peak electron spectroscopy using different spectrometers

Cited by 16 publications

References 14 publications

Influence of Recoil Effect and Surface Excitations on the Inelastic Mean Free Paths of Electrons in Polymers

Influence of Recoil Effect and Surface Excitations on the Inelastic Mean Free Paths of Electrons in Polymers

Inelastic mean free path measurements of electrons near nickel surfaces

Determination of the inelastic mean free path of electrons in polyaniline samples by elastic peak electron spectroscopy

Contact Info

Product

Resources

About