Determination of the guardbanding to ensure acceptable risk decision in the declaration of conformity

Mezouara, Hicham; Dlimi, Latifa; Salih, Abdelouahhab; Afechcar, Mohamed

doi:10.1051/ijmqe/2015013

Cited by 4 publications

(2 citation statements)

References 7 publications

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“…The linear approximation of an actual marginal manufacturing cost under the reference condition, as shown in figure 5, is a possible interpretation of expression (20). Although it may be a difficult task to obtain the actual marginal manufacturing cost, the relationships given by expressions ( 38 In other words, the specific form of g(W) is not required for the purpose of this study.…”

Section: Possible Interpretation Of the Proposed Manufacturing Costmentioning

confidence: 99%

“…Forbes [17] not only suggested a way to determine acceptance interval based on the Bayesian decision-making approach but also showed the influence of unknown systematic effects associated with the measurement system. Other interesting studies [18][19][20][21][22] were introduced in Pendrill's reviews or reported recently. Some of the above studies were incorporated in JCGM 106.…”

Section: Introductionmentioning

confidence: 99%

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Economic optimization of acceptance interval in conformity assessment: 1. Process with no systematic effect

Shirono

Tanaka

Koike³

2022

Metrologia

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In inspections for conformity assessment, an acceptance interval smaller than the tolerance interval is often determined in order to reduce the risk of consumers obtaining non-conforming items in the market. The presence of non-conforming items in the market impairs the evaluation of items by customers and may have an impact on revenue by decreasing prices. However, setting too small an acceptance interval reduces the revenue from the process by decreasing the number of the items available in the market. We thus propose a method to determine the optimum acceptance interval in conformity assessment by means of maximization of the revenue from processes. For this purpose, we give a mathematical model for the price of an item and its cost in the production process. Through theoretical analysis and simulations, it is shown that a parameter in the price model is the key in the optimization. In this paper we report a method for processes where no systematic effect component of measurement uncertainty exists, and in part 2 of this series we will report an extended method in which systematic effects are taken into consideration.

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Section: Possible Interpretation Of the Proposed Manufacturing Costmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Economic optimization of acceptance interval in conformity assessment: 1. Process with no systematic effect

Shirono

Tanaka

Koike³

2022

Metrologia

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Modified short-run statistical process control for test and measurement process

Koh

Chin

Kamaruddin

2018

Int J Adv Manuf Technol

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Application of Diverse Testing to Improve Integrated Circuit Test Yield and Quality

Yeh,

Chen,

Liao

2024

Eng

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This paper utilizes the digital integrated circuit testing model to compute the test yield curve of future wafers and explore the influence of test guardband (TGB) on quality and yield. With the passage of three years since the COVID-19 pandemic disrupted semiconductor production lines, the semiconductor manufacturing industry still faces chip shortages. Although initiatives such as the CHIPS and Science Act in the United States have helped stabilize chip supply chains, manufacturers still face inventory shortages and delayed deliveries. Moreover, the backwardness and inaccuracy of semiconductor test equipment have led to a decline in both test yield and wafer quality, resulting in reduced shipments. Therefore, to mitigate yield losses and enhance the test yield and shipment volume of semiconductor products, this paper proposes a diverse test method (DTM) to improve test outcomes through the alteration of the testing strategy and TGB adjustment. Furthermore, according to the wafer estimation table published in the IEEE International Roadmap for Devices and Systems (2023), the proposed DTM can effectively enhance the test yield of wafers and improve the testing capabilities of ATE testers (automatic test equipment). Consequently, suppliers can stabilize the chip supply chain and enhance their companies’ profits and reputation by improving chip test yield.

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Determination of the guardbanding to ensure acceptable risk decision in the declaration of conformity

Cited by 4 publications

References 7 publications

Economic optimization of acceptance interval in conformity assessment: 1. Process with no systematic effect

Economic optimization of acceptance interval in conformity assessment: 1. Process with no systematic effect

Modified short-run statistical process control for test and measurement process

Application of Diverse Testing to Improve Integrated Circuit Test Yield and Quality

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