2018
DOI: 10.1007/s00170-018-2776-1
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Modified short-run statistical process control for test and measurement process

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Cited by 5 publications
(2 citation statements)
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“…These can be based on coding systems such as those proposed by Al-Salti and Statham 12 and Zhu et al 13 or on clustering algorithms as introduced by Wiederhold. 14 Shewhart-styled or similar charting techniques for grouped characteristics are also presented by Bothe, 15 Evans and Hubele, 16 Kimbler and Sudduth, 17 Koh et al, 18,19 Lin et al, 20 Koons and Luner, 21 and Wheeler. 22 A main problem with these charts is the requirement that samples from different processes follow nearly identical distributions.…”
Section: Introductionmentioning
confidence: 99%
“…These can be based on coding systems such as those proposed by Al-Salti and Statham 12 and Zhu et al 13 or on clustering algorithms as introduced by Wiederhold. 14 Shewhart-styled or similar charting techniques for grouped characteristics are also presented by Bothe, 15 Evans and Hubele, 16 Kimbler and Sudduth, 17 Koh et al, 18,19 Lin et al, 20 Koons and Luner, 21 and Wheeler. 22 A main problem with these charts is the requirement that samples from different processes follow nearly identical distributions.…”
Section: Introductionmentioning
confidence: 99%
“…Several possible sources of error are equipment accuracy, operator mistakes, environmental factors and random noise. Measurement errors can lead to unnecessary process adjustments and loss of confidence in SPC [32]. Third, the production of customised products and services are characterised by complex designs and processes, requiring more flexible quality management practices.…”
Section: Introductionmentioning
confidence: 99%