Determination of the Optimal Frequency O F the Primary Measuring Transducer of the Thickness of Dielectric Coatings of Meta L Surfaces

Abstract

The article provides an analysis of the physical processes underlying the operation of the measuring transducer, with a time based information presentation. A mathematical model is developed that describes the process of free oscillation attenuation excited in the LC-contour of primary measuring transducer, and analyzes and evaluates the influence of external factors that influence the measurement results. The ways of elimination of their influence on the results of measuring control are offered.