Abstract:We report a fast and accurate method to obtain the recombination lifetime from CV measurements on MOS structures in the context of a regular CV testing. The simultaneous measurement of the gate current and the high frequency gate capacitance in the non-equilibrium nonsteady state in response to a linear gate voltage ramp, started in inversion equilibrium towards accumulation, enables the self-consistent determination of the forward current-voltage characteristic of the field-induced pn junction. The applicatio… Show more
Set email alert for when this publication receives citations?
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.