2007
DOI: 10.7498/aps.56.3374
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Determination of the region where Si nanoparticles form during pulsed laser ablation

Abstract: To determinate the nucleation region of Si nanoparticles formed in gas phase, the single crystalline Si target with high resistivity was ablated by a XeCl excimer laser in pure Ar gas under the ambient pressure of 10Pa, and the nanocrystalline Si films were systemically deposited on pieces of glass or single crystalline (111) Si substrates lined up at a distance of 2.0cm under the plasma. The Raman and X-ray diffraction spectra, scanning electron microscope and atomic force microscope images of the films show… Show more

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