2017
DOI: 10.1016/j.physe.2017.04.019
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Determination of the transport lifetime limiting scattering rate in InSb/Al x In 1−x Sb quantum wells using optical surface microscopy

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Cited by 4 publications
(3 citation statements)
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“…Figure 2(f) shows the field-effect mobilities extracted from the gate-transfer characteristic measurements of the device at different temperatures. It is seen that the mobility tends to saturate at low temperatures (below ∼77 K), in good agreement with the results obtained from InSb QWs [15], but decreases exponentially with increasing temperature at high temperatures (above ∼100 K). In the considered temperature range, the temperature-dependent mobility μ(T) in the InSb nanosheet can be approximately expressed as…”
Section: Gate-transfer Characteristic Measurements Of the Singlegate ...supporting
confidence: 89%
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“…Figure 2(f) shows the field-effect mobilities extracted from the gate-transfer characteristic measurements of the device at different temperatures. It is seen that the mobility tends to saturate at low temperatures (below ∼77 K), in good agreement with the results obtained from InSb QWs [15], but decreases exponentially with increasing temperature at high temperatures (above ∼100 K). In the considered temperature range, the temperature-dependent mobility μ(T) in the InSb nanosheet can be approximately expressed as…”
Section: Gate-transfer Characteristic Measurements Of the Singlegate ...supporting
confidence: 89%
“…Here, term / 1 imp m describes contributions from all scattering events due to imperfections, such as impurities, defects, charge traps, surface/interface roughness etc., in the nanosheet, its surface native oxides and the dielectrics [15,50]. This term is, to the lowest order approximation, temperature independent.…”
Section: Gate-transfer Characteristic Measurements Of the Singlegate ...mentioning
confidence: 99%
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