2018
DOI: 10.1021/acs.jpcc.8b04522
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Determining the Complex Refractive Index of Neat CdSe/CdS Quantum Dot Films

Abstract: Understanding how structural and synthetic factors influence the complex refractive index of quantum dot (QD) solids is crucial to tailoring the light−matter interactions of QD-containing photonic and optoelectronic devices. However, neat QD films are challenging to accurately model as they are a mixture of inorganic core/shell materials and surrounding organic ligands. Furthermore, both the QD film morphology and the complex refractive index vary due to particle size, ligand chain length, and the deposition p… Show more

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Cited by 32 publications
(46 citation statements)
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References 54 publications
(113 reference statements)
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“…For CdSe QD thin films, the QDs are zincblende nanocrystals (size ~4 nm) stabilized with 3-mercaptopropionic acid (3-MPA) after treatment via solid-state ligand exchange 66 . The resulting thin films have a very low extinction coefficient (k = 0.05 at excitonic peak, λ = 575 nm), and are therefore paired with a wider energy gap small molecule 2,3,6,7-tetrahydro-1,1,7,7,-tetramethyl-1H,5 H,11H-10-(2-benzothiazolyl)quinolizino[9,9a,1gh]coumarin (C545T), which does not absorb at λ = 575 nm.…”
Section: Resultsmentioning
confidence: 99%
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“…For CdSe QD thin films, the QDs are zincblende nanocrystals (size ~4 nm) stabilized with 3-mercaptopropionic acid (3-MPA) after treatment via solid-state ligand exchange 66 . The resulting thin films have a very low extinction coefficient (k = 0.05 at excitonic peak, λ = 575 nm), and are therefore paired with a wider energy gap small molecule 2,3,6,7-tetrahydro-1,1,7,7,-tetramethyl-1H,5 H,11H-10-(2-benzothiazolyl)quinolizino[9,9a,1gh]coumarin (C545T), which does not absorb at λ = 575 nm.…”
Section: Resultsmentioning
confidence: 99%
“…This allows active materials to be selected solely on the basis of realizing a minimal overlap in optical absorption. The QD film thickness is controlled by the number of cycles for the ligand exchange process 66 . Figure 5e shows the C545T-CdSe QD η D ratio as a function of C545T thickness for two different QD film thicknesses (see Supplementary Figure 9 for broadband η EQE , η A and η IQE spectra).…”
Section: Resultsmentioning
confidence: 99%
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“…2d , with the increase of electric field force, the size of oligomer changes little, while the film thickness decreases and the packing density increases. In addition, the refractive index ( n ) associated with packing density 41 of films can also be tuned by an electric field (Supplementary Fig. 11 ), such as the n @630 nm (Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The complex refractive index of the thin CQW films was determined using ellipsometry in accordance with the previous literature. [ 41,42 ] Ellipsometric data was collected from a multilayered CQW sample deposited on silicon at 400–1000 nm range with 10 nm steps and at three different incidence angles of 65°, 70°, and 75°. The thickness of the sample was determined from the spectral region across which the CQWs are non‐absorbing (700–1000 nm) using a Cauchy model.…”
Section: Methodsmentioning
confidence: 99%