Determining the Preferred Orientation of Silver-Plating via X-ray Diffraction Profile

Abstract

Determining the preferred orientation of plating film is of practical importance. In this work, the Rietveld method and quantitative texture analysis (RM+QTA) are used to analyze the preferred orientation of plating silver film with XRD profile, whose <311> axial texture can be completely described by a set of exponential harmonics index, extracted from a single XRD profile, C41,1(0.609), C61,1(0.278), C81,1(−0.970). The constructed pole figures with the index of the exponential harmonic are following those measured by the multi-axis diffractometer. The method using exponential harmonic index can be extended to characterize the plating by electroplating in a quantitative harmonic description. In addition, a new dimension involving crystallite shape and size is considered in characterizing the preferred orientation.

Effect of boron-doping and annealing on the structure, morphological and optical properties of ZnO films prepared by spray pyrolysis method

“…XRD analysis of the films before and after annealing reveals several diffraction peaks at 31.8°, 34.4°, 36.3°, and 56.7°, corresponding to the (100), (002), (101), and (110) crystallographic planes in ZnO (see figure 1), which exhibit a wurtzite hexagonal crystal structure consistent with previous reports [29,30]. All the films exhibit a polycrystalline structure with a dominant peak at 34.42°, indicating preferential grain orientation along the c-axis [31]. This preferential orientation is preserved across all annealing temperatures.…”

Multi-scale morphology characterization of hierarchically porous silver foam electrodes for electrochemical CO2 reduction

“…It has been argued that Ag may deposit preferably in ( 111) and (200) orientation, since these orientations show the lowest surface energy. However, the (311) orientation is theoretically even more preferred when regarding the combination of surface and strain energy minimization 32,33 . In our study, we found that the (111) orientation is preferred for the Ag deposition under DHBT conditions.…”

Synthesis and study of enhanced electrochemical properties of NiO nanoparticles deposited on TiO2 nanotubes

“…In the intensity calculations, the Lorentz factor is joined with the polarization factor and further, the variation of the Lorentz's factor with the Bragg angle (θ) is shown. [55][56][57][58] The general effect of the Lorentz factor is to diminish the intensity of the reflections at intermediate angles contrasted with those in the forward or backward directions. Lorentz factor and Lorentz Polarization factor are determined from Equations ( 17) and ( 18) separately and arranged in Table 6.…”