2008
DOI: 10.1016/j.jnucmat.2007.08.020
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Detrapping behavior of tritium trapped via hot atom chemical process in neutron-irradiated ternary lithium oxides

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Cited by 16 publications
(5 citation statements)
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“…In addition, release temperature of Peak 2 is close to that of annihilation of irradiation defects for Li 2 TiO 3 . It is expected that the irradiation defects would act as tritium trapping sites in lithium ceramics [11]. It is also reported that the annihilation of irradiation defects would trigger the release of tritium from lithium ceramics [12,13].…”
Section: Resultsmentioning
confidence: 99%
“…In addition, release temperature of Peak 2 is close to that of annihilation of irradiation defects for Li 2 TiO 3 . It is expected that the irradiation defects would act as tritium trapping sites in lithium ceramics [11]. It is also reported that the annihilation of irradiation defects would trigger the release of tritium from lithium ceramics [12,13].…”
Section: Resultsmentioning
confidence: 99%
“…The accumulation of point defects, formation of extended defects and presence of gas species in LiAlO 2 are expected to affect the structural stability, thermomechanical properties, and tritium migration. Previous studies of LiAlO 2 reported in the literature have addressed technical issues of structural defects, volume swelling, micro-cracking, tritium detrapping, diffusion and release using various radiation sources, including x-rays and -rays [4,5], electrons [6,7], neutrons [8][9][10][11][12], and ions [13][14][15]. Modeling of tritium transport [16][17][18] and molecular dynamics (MD) calculations of threshold displacement energies [19], defect production [20,21] and Li diffusion [22] have also been carried out.…”
Section: Introductionmentioning
confidence: 99%
“…Here, it was reported that the activation energy of oxygen diffusion as 0.41 eV [5], and this value was a little smaller than the defects. If the process 1 was rate-determining process of annihilation behavior for irradiation defects, activation energy of annealing for irradiation defects could be constant.…”
Section: Resultsmentioning
confidence: 79%
“…3 shows the correlation between the amounts of E -center and O-related defects as a function of annealing temperature. It was reported that the annihilation process of irradiation defects might be attributed to oxygen recovery to E -center via the oxygen diffusion, and to diffusion of trapped electrons which acts as radical scavengers [5]. Moreover, E -center and O-related defects referred as Frenkel pair [11] and it was considered that the annihilation processes of these defects were proceeded by recombination of E -center and O-related defects.…”
Section: Resultsmentioning
confidence: 99%
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