2022
DOI: 10.1007/s12274-022-4469-1
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Development and characterization of photovoltaic tandem-junction nanowires using electron-beam-induced current measurements

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Cited by 6 publications
(13 citation statements)
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“…As seen from Figure b,c, a positive EBIC current is observed when the electron beam illuminates either of the subcells, while a negative current is measured at the position of the Esaki tunnel junction under the applied forward bias conditions due to the opposite direction of the junction. These observations are in agreement with previously reported results and confirm that the doping profile of the tandem-junction photovoltaic NWs is as intended.…”
Section: Resultsmentioning
confidence: 99%
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“…As seen from Figure b,c, a positive EBIC current is observed when the electron beam illuminates either of the subcells, while a negative current is measured at the position of the Esaki tunnel junction under the applied forward bias conditions due to the opposite direction of the junction. These observations are in agreement with previously reported results and confirm that the doping profile of the tandem-junction photovoltaic NWs is as intended.…”
Section: Resultsmentioning
confidence: 99%
“…To investigate whether the functional structure on the NWsincluding two n–i–p subcells connected by an Esaki tunnel diodeworks as intended, we performed EBIC measurements. EBIC has previously been shown to be a valuable tool for the development and characterization of photovoltaic NWs. ,, It is used to verify the doping profile and junction locations and, in combination with I – V measurements, study the electrical properties of the NW, including V OC addition and the current output under illumination with the electron beam. ,, Figure shows the results of EBIC measurements of an NW on a representative sample; further measurements are shown in Figure S4. As seen from Figure b,c, a positive EBIC current is observed when the electron beam illuminates either of the subcells, while a negative current is measured at the position of the Esaki tunnel junction under the applied forward bias conditions due to the opposite direction of the junction.…”
Section: Resultsmentioning
confidence: 99%
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“…The results are interpreted in terms of the Ga composition in the InGaP top cell, the existence of an InGaP thin shell laterally grown around the InP bottom cell, and the associated strain, and the role of doping in the luminescence emission of the InP bottom cell. It should be noted that while the photoelectric characteristics of these NWs are not directly addressed in this work, relevant data for similar NWs can be found in the literature for interested readers [15,16].…”
Section: Introductionmentioning
confidence: 99%