In this work we demonstrate that inhomogeneous illumination of state-of-the-art solar modules with three bypass diodes results in hot cells with critical peak temperatures of 164 °C. We examine two solar modules in the hot spot endurance test, one with 367.3 WP featuring 72 full cells and the other with 388.6 WP featuring 144 half cells. For the module with 72 cells we measure a maximum temperature of 164 °C, which results in a degradation of the encapsulation material and increases the risk of module failure. Our experiments show that the half cell module is advantageous in the hot spot endurance test compared to the full cell module. Although the half cell module has a higher power output than the full cell module we measure a cooler peak temperature of 150 °C. We also show that under certain shading conditions, the half cell module exhibits similar temperatures as the full cell module. Based on our experimental results we develop an electrical and a thermal model to predict the temperature of future solar modules in the hot spot endurance test. In our prediction we consider the trends of further increasing cell and module efficiencies, larger wafer formats, and larger solar modules. For the worst case we simulate a peak temperature of 176 °C at the module's surface, which significantly increases the risk of module failure. Our results show that future modules employing bifacial solar cells that are made from larger wafer formats, need a new protection against overheating. Three bypass diodes per module are no longer sufficient.