2020
DOI: 10.1109/jphotov.2020.3021348
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Three Bypass Diodes Architecture at the Limit

Abstract: In this work we demonstrate that inhomogeneous illumination of state-of-the-art solar modules with three bypass diodes results in hot cells with critical peak temperatures of 164 °C. We examine two solar modules in the hot spot endurance test, one with 367.3 WP featuring 72 full cells and the other with 388.6 WP featuring 144 half cells. For the module with 72 cells we measure a maximum temperature of 164 °C, which results in a degradation of the encapsulation material and increases the risk of module failure.… Show more

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Cited by 20 publications
(6 citation statements)
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“…The most important mechanism for junction breakdown in monocrystalline silicon solar cells is avalanche breakdown [16,17]. This breakdown occurs at reverse bias voltages below À20V for PERC cells, the most common type of mass-produced solar cell [10]. Junction breakdown occurs at the weakest point in the cell area.…”
Section: Hot-spot Phenomenamentioning
confidence: 99%
See 1 more Smart Citation
“…The most important mechanism for junction breakdown in monocrystalline silicon solar cells is avalanche breakdown [16,17]. This breakdown occurs at reverse bias voltages below À20V for PERC cells, the most common type of mass-produced solar cell [10]. Junction breakdown occurs at the weakest point in the cell area.…”
Section: Hot-spot Phenomenamentioning
confidence: 99%
“…In contrast, the International Energy Agency (IEA) states that the hot-spot can be caused by (i) reverse bias and junction breakdown of a solar cell, (ii) damaged cell, or (iii) damaged metallisation [9]. The reason why the term "hotspot" is defined differently is explained in [10].…”
Section: Introductionmentioning
confidence: 99%
“…The primary protection approach utilized recently against reverse bias situations is a passive bypass Schottky diode that is arranged in parallel with a string of cells [ 31 , 32 , 33 ]. Additionally, the latest investigations emphasize alleviating the influence of localized overheating or hot spots and improving the module reliability by adapting the bypass (protection) circuit [ 34 , 35 , 36 , 37 , 38 , 39 ]. However, the protection circuits or the bypass Schottky diodes can result in consuming more power and complicating the design, as well as raising the module costs.…”
Section: Introductionmentioning
confidence: 99%
“…For a PV array, edge soiling causes inhomogeneous solar irradiance, leading to an electrical mismatch between the components, and aggravating the power output [13][14][15]. Bypass diodes have been introduced to mitigate the current mismatch between series [16]. However, they also bring multiple electrical power output peaks in the power characteristic curves.…”
Section: Introductionmentioning
confidence: 99%