Development, characterization and qualification of first GEM foils produced in India

Shah, Aashaq; Ahmed, A.; Gola, M.; Sharma, R.; Malhotra, S.; Kumar, Ashok; Naimuddin, M.; Menon, Pradeep; Srinivasan, Koottalai

doi:10.1016/j.nima.2018.02.078

Cited by 6 publications

(7 citation statements)

References 19 publications

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“…Figure 5(d) demonstrates that leakage current reduces from 1.983 nA to 0.713 nA (∼ 64% change) in the first half hour, then decreases to 0.694 nA (∼ 3% change) in the second half hour, and then remains constant for the remaining measurement time. CERN and Micropack foils [21] had similar results.…”

Section: Electrical Assessmentsupporting

confidence: 54%

The qualification of GEM detector and its application to imaging

Ahmed¹,

Kumar²,

Naimuddin³

et al. 2022

J. Inst.

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The Gas Electron Multiplier (GEM) is a new age detector, which can handle the high flux of particles. The GEM foil, which is constructed using 50 μm highly insulating foil (Kapton/Apical) coated with 5 μm layers of copper, on both sides, with a network of specifically shaped holes is the major component of these detectors. The European Center for Nuclear Research (CERN) has been the sole supplier of the GEM foils until recently when a few other companies started manufacturing GEM foils under the transfer of technology (TOT) agrement from CERN. Techtra is one such company in Europe which gained a right to use CERN developed technology in order to produce commercially viable GEM foils. Micropack Pvt. Ltd. is another company in India which has successfully manufactured good quality GEM foils. Due to the microscopic structure of holes and dependence on the electric field inside, it becomes essential to study the defect and uniformity of holes along with the electrical property of foils under ambient conditions. In this work we are reporting the tests condition of Techtra GEM foils. We report on the development of a cost effective and efficient technique to study the GEM foils holes geometry, distribution, and defects. We also report on the electrical properties of these foils like leakage current, stability, and discharges. At the detector level, we describe the high voltage (HV) response, gain, uniformity, and stability. The GEMs have been proposed to have a wider applications, so we performed a feasibility study to utilize these for the imaging. We irrediated various objects of varying density with X-rays and reconstructed the images. The reconstructed image shows a good distinction between materials of different densities, which can be very useful in various applications like medical imaging or cargo imaging.

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Section: Electrical Assessmentsupporting

confidence: 54%

The qualification of GEM detector and its application to imaging

Ahmed¹,

Kumar²,

Naimuddin³

et al. 2022

J. Inst.

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“…Process of manufacturing GEM foils can introduce occasional defects which may affect the performance of a GEM detector. During optical scanning of these commercially manufactured GEM foils, different types of defects were observed like over-etched, under-etched, unetched, burnt, merged holes etc., which were mainly due to the etching process [13]. These are broadly divided into two types: Insulator defects and Copper defects.…”

Section: Correlation Between Foil Defects and Uniformitymentioning

confidence: 99%

“…Section 4.4 explains the method used for getting information on uniformity of detector. We have also performed correlation study between the gain uniformity and various defects present in the foil [13] in Section 4.5.…”

Section: Detector Characteristicsmentioning

confidence: 99%

“…These foils have been distributed for testing at few institutes within India, including University of Delhi (DU). We have performed the geometrical studies along with the leakage current measurement of these foils for short and long durations [13]. In this paper, we report on the performance of a GEM detector assembled using these first commercially manufactured foils in India.…”

Section: Introductionmentioning

confidence: 99%

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Performance of the triple GEM detector built using commercially manufactured GEM foils in India

Gola

Malhotra

Shah

et al. 2020

Nuclear Instruments and Methods in Physics Research Section A:

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The Gas Electron Multiplier (GEM) detectors has been utilized for various applications due to their excellent spatial resolution, high rate capabilities and flexibility in design. The GEM detectors stand as a promising device to be used in nuclear and particle physics experiments. Many future experiments and upgrades are looking forward to use this technology leading to high demand of GEM foils. Until now, CERN is the only reliable manufacturer and distributor of GEM foils, but with technology transfer, few other industries across the globe have started manufacturing these foils employing the same photo-lithographic technique. The Micropack Pvt. Ltd. is one such industry in India which produced first few 10 cm × 10 cm GEM foils, which were then distributed to few collaborating partners for testing reliability and performance of foils before they can be accepted by the scientific community. Characterization of three such foils have already been performed by studying their optical and electrical properties. Using these foils a triple GEM detector has been built and various performance characteristics have been measured. In this paper, we specifically report measurements on gain, resolution and response uniformity, by utilizing local quality control set-ups existing at University of Delhi.

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“…The data was recorded using the SRS shown in Figure 2, which has been developed by the RD51 collaboration at CERN. The CMS GEM collaboration use this system for the quality assurance of the GEM detector [14,15,16]. The SRS has been used to control and read the APV25 front end ASIC.…”

Section: Setupmentioning

confidence: 99%

A new technique to establish the uniformity of the induction gap in GEM based detector

Gola

2020

Preprint

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This work is proposing and exploring the use of multichannel readout electronics, already used in quality assurance for gain uniformity studies, to measure the uniformity of the induction gap in GEM based detectors. The measurement will furthermore provide a qualification of the readout electrodes in terms of disconnected or shorted channels. The proposed method relies on the dependence on the induction gap capacitance between the readout strips and the bottom of the GEM. The measurement is obtained inducing capacitively a signal on the readout strips pulsing the bottom layer of the GEM foil. In this work, the signals are read with the analog APV25 front-end chip and the RD51 Scalable Readout System (SRS). Studies on small and large area GEM detectors, relative variations under mechanical stress, and in presence of electrical fields will be shown. Sensitivity to defects in the readout plane will be proven.

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Development, characterization and qualification of first GEM foils produced in India

Cited by 6 publications

References 19 publications

The qualification of GEM detector and its application to imaging

The qualification of GEM detector and its application to imaging

Performance of the triple GEM detector built using commercially manufactured GEM foils in India

A new technique to establish the uniformity of the induction gap in GEM based detector

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