Development of a novel ellipsometer based on a four-detector photopolarimeter

Masetti, Enrico; Silva, M.P. de

doi:10.1016/0040-6090(94)90730-7

Cited by 20 publications

(4 citation statements)

References 6 publications

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“…Subsequently, an ac voltage (sine wave voltage ramp, 5 kHz, with amplitude ranging from 3.5 V to 9 V, step ± ( ) 18 2 mV) is applied to measure the SPs S 0 , S 1 , S 2 and S 3 of the transmitted light. A Four Detector Photopolarimeter is employed to simultaneously measure the SPs [25][26][27]. We note that the response time of our polarimeter (μs scale) is faster than the evolving time of the liquid crystal director (ms scale) for this reason, for a single laser shot the NLC configuration can be considered static.…”

Section: Methodsmentioning

confidence: 99%

An approach to a model disordered birefringent medium for light depolarization applied to a liquid crystal device

Vena

Massarelli

Carbone

et al. 2014

J. Opt.

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A general model consisting of micro-wave plates is presented as a straightforward extension of Jones–Mueller calculus in order to describe the effect that undergoes a perfectly polarized quasi-monochromatic light beam transmitted through a disordered birefringent medium. The model treats the birefringent medium as an array of micro-wave plates lying side by side. The transmitted light beam results spatially divided in micro-beams which inherit from micro-wave plates different polarization states and hence, spatial depolarization is achieved. The model is applied to a liquid crystal sandwich-like cell subject to a splay-bend perturbation in the bulk. The model output is cast against the experimental data with a set of parameters throughout simulations. A good agreement is obtained between experimental data and model results.

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Section: Methodsmentioning

confidence: 99%

An approach to a model disordered birefringent medium for light depolarization applied to a liquid crystal device

Vena

Massarelli

Carbone

et al. 2014

J. Opt.

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“…Such a measurement requires calibration of the photometer, obtained by placing a linear polarizer and a quarter-wave retarder in front of the photopolarimeter, and measuring the output for a series of polarization states. 5 However, when such components are not readily available, the instrument may still be used in an uncalibrated state, as described in the following paragraphs.…”

Section: ͑1͒mentioning

confidence: 99%

“…Nevertheless, with multiple detectors one can eliminate these variations by using normalized intensities. 5 Thus, for a four detector polarimeter, we define normalized outputs i n Ј:…”

Section: ͑1͒mentioning

confidence: 99%

Use of a four detector photopolarimeter for Kerr effect measurements

Dumelow

Silva

Chianca

et al. 2002

Review of Scientific Instruments

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Articles you may be interested inVersatile magneto-optic Kerr effect polarimeter for studies of domain-wall dynamics in magnetic nanostructures Rev. Sci. Instrum. 77, 103901 (2006); 10.1063/1.2356856 Bragg magneto-optical Kerr effect measurements at Co stripe arrays on Fe(001) J. Appl. Phys. 97, 073909 (2005); 10.1063/1.1868853 Electrochemical cell for in situ magneto-optic Kerr effect measurements Rev. Sci. Instrum. 74, 4723 (2003); 10.1063/1.1619583 High-speed high spatial resolution magneto-optic Kerr effect polarimeter/microscope for studies of ultrathin magnetic structures Rev. Sci. Instrum. 71, 3141 (2000)

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“…This causes optical modules and equipment as a whole to be large. On the other hand, static ellipsometers, or snapshot ellipsometers, are reported [2][3][4][5][6] that do not require either optical or electric modulation. Division-of-wavefront photopolarimeters [2] have a simple configuration and thus require no complicated alignment, unlike division-of-amplitude photopolarimeters [3][4][5][6].…”

Section: Introductionmentioning

confidence: 99%

Compact ellipsometer employing a static polarimeter module with arrayed polarizer and wave-plate elements

et al. 2007

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A portable ellipsometer with a compact static polarimeter using an arrayed polarizer, an arrayed wave plate, and a CCD image sensor is developed. A high level of repeatability at a measurement speed of 0.3 s is demonstrated by measurement of SiO(2) films ranging from 2 to 300 nm in thickness deposited on an Si wafer. There is the potential to realize an ultracompact ellipsometer module by integrating the optical source and receiver, suitable for deployment in a variety of manufacturing equipment and measurement instruments.

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Development of a novel ellipsometer based on a four-detector photopolarimeter

Cited by 20 publications

References 6 publications

An approach to a model disordered birefringent medium for light depolarization applied to a liquid crystal device

An approach to a model disordered birefringent medium for light depolarization applied to a liquid crystal device

Use of a four detector photopolarimeter for Kerr effect measurements

Compact ellipsometer employing a static polarimeter module with arrayed polarizer and wave-plate elements

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