2019
DOI: 10.1063/1.5081896
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Development of a reliable probes in situ linear exchange module based on an environment control atomic force microscope

Abstract: In this work, a reliable atomic force microscope (AFM) probes in situ linear exchange module based on a scanned-sample environment control AFM was developed. The reliability and functionality of the module were experimentally verified through surface topography scanning tests and wear tests under different conditions. The module is able to install up to three AFM probes simultaneously, and in situ exchange different AFM probes inside the chamber so that different measurements in the designated environments can… Show more

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