2019
DOI: 10.15587/1729-4061.2019.156565
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Development of a technique for restoring the efficiency of film ITO/CdS/CdTe/Cu/Au SCs after degradation

Abstract: Проведено дослiдження впливу прямої полярностi на вихiднi параметри сонячних елементiв (СЕ) ITO/CdS/CdTe/Cu/Au. Експериментально зафiксовано вплив електричного поля прямої полярностi на вихiднi параметри i свiтловi дiоднi характеристики СЕ ITO/CdS/CdTe/Cu/Au, у яких вiдбулася деградацiя ККД. При витримцi затемненого СЕ не менше 120 хвилин в електричному полi, наведеним зовнiшньою постiйною напругою величиною (0,5-0,9) В, спостерiгається зростання ККД. Полярнiсть електричного поля повинна вiдповiдати прямому зм… Show more

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Cited by 7 publications
(12 citation statements)
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“…To analyze the degradation stability according to the method described in [2], ITO/ CdS/CdTe/Cu/ITO SCs with a base layer thickness of 1 μm were studied under illumination The results of a study of the degradation stability of the ITO/CdS/CdTe/Cu/ITO PECs with t bl =1 μm were obtained by analytical processing of the light CVCs (Fig. 2), the initial parameters and LDC were determined upon irradiation on both sides (Tables 3, 4).…”
Section: The Results Of the Study Of The Degradation Stability Of mentioning
confidence: 99%
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“…To analyze the degradation stability according to the method described in [2], ITO/ CdS/CdTe/Cu/ITO SCs with a base layer thickness of 1 μm were studied under illumination The results of a study of the degradation stability of the ITO/CdS/CdTe/Cu/ITO PECs with t bl =1 μm were obtained by analytical processing of the light CVCs (Fig. 2), the initial parameters and LDC were determined upon irradiation on both sides (Tables 3, 4).…”
Section: The Results Of the Study Of The Degradation Stability Of mentioning
confidence: 99%
“…Using expression (2) and experimentally obtained values of In and V n , by varying the values of the above coefficients А 0 , А 1 , А 2 , А 3 , А 4 , the best approximation of the experimental data is obtained, I n =I n (V n ), described by the transformed theoretical expression (2). Usually, during analytical processing, the average deviation does not exceed 10 -8 , which corresponds to a relative error in the determination of the initial parameters and LDC at a level of no more than 1 %.…”
Section: Methods Of Measurement and Analytical Processing Of Light Cumentioning
confidence: 99%
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“…However, in the previously published papers [14,[18][19][20], the role of two space charge regions with the built-in electric field remains out of view. Considering the effect of the built-in electric field of the n-p heterojunction on the SC parameters during operation, it should be taken into account that in this region, after the SC production, there is more copper than in the absorber region [23,24].…”
Section: Results Of the Study Of Spectral Dependences Of Sc After mentioning
confidence: 99%
“…The production of 10 ×10 cm experimental specimens of SC was carried out according to the standard procedure for CdTe, i. e., by thermal vacuum evaporation using a UVN67 vacuum unit with modified internal equipment. [20] The thickness of the CdTe base layer was 2.5 µm. The internal equipment of the unit is shown in Fig.…”
Section: Materials and Methods For Cdte Sc Researchmentioning
confidence: 99%