2011
DOI: 10.1002/pip.1134
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Development of gallium gradients in three‐stage Cu(In,Ga)Se2 co‐evaporation processes

Abstract: We use secondary-ion mass spectrometry (SIMS), X-ray diraction (XRD) and scanning electron microscopy (SEM) to investigate the development over time of compositional gradients in Cu(In, Ga)Se 2 thin lms grown in threestage coevaporation processes, and suggest a comprehensive model for the formation of the well-known`notch' structure. The model takes into account the need for compensating Cu diusion by movement of group-III ions in order to remain on the quasi-binary tie line and indicates that the mobilities o… Show more

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Cited by 56 publications
(25 citation statements)
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“…This could be a consequence of lateral Ga accumulation due to preferential In reactivity at facets of preferential growth. A similar mechanism has been used to explain the formation of Ga gradients in three-stage CIGS growth [12]. The appearance of small voids even before recrystallization could arise due to the formation of empty spaces between growing crystallites.…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…This could be a consequence of lateral Ga accumulation due to preferential In reactivity at facets of preferential growth. A similar mechanism has been used to explain the formation of Ga gradients in three-stage CIGS growth [12]. The appearance of small voids even before recrystallization could arise due to the formation of empty spaces between growing crystallites.…”
Section: Discussionmentioning
confidence: 99%
“…A good understanding has been achieved regarding the formation of beneficial GGI gradings across the depth of the CIGS absorbers [11,12], and also the existence of voids in the CIGS layer has previously been reported [13,14]. However, the formation mechanism of lateral inhomogeneities of the CIGS composition has not been investigated yet.…”
Section: Introductionmentioning
confidence: 99%
“…Finally, in the third step, In, Ga, and Se are evaporated, and the deposition is terminated when the desired composition and thickness are reached. More detailed information on this process can be found in previous studies [7,[11][12][13][14][15][16]. The success of this method has commonly been attributed to two properties: (1) the growth of CIGS with large grains [17]; and (2) the self-formation of an optimized Ga gradient [14].…”
Section: Introductionmentioning
confidence: 99%
“…The SIMS analyses suggest that the surface compositions correspond to Ga/(Ga + In) ratios of 0.44 and 0.32 for the reference and the 100 nm top layer samples, respectively. The formation of the notch‐like in‐depth variation of Ga/(Ga + In) is discussed more in detail in another study , where we observe that copper migration in one direction leads to preferential indium migration (as compared with gallium migration) in the opposite direction. As the final part in the three‐stage process is copper‐free, we believe that out‐diffusion of copper to the growth front may have enhanced indium–gallium intermixing between the bulk and the top layer.…”
Section: Resultsmentioning
confidence: 66%
“…Cu(In,Ga)Se 2 layers were prepared by co‐evaporation of the elements onto Mo‐coated soda‐lime glass substrates. The deposition followed a three‐stage process as described in an earlier publication , with metals being evaporated from open boat sources and their rates controlled by means of mass‐spectrometer feedback. The rates and temperatures are shown as functions of time in Figure .…”
Section: Methodsmentioning
confidence: 99%