2021
DOI: 10.1007/s10971-021-05650-7
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Development of homogenous n-TiO2/ZnO bilayer/p-Cu2O heterostructure thin film

Abstract: Metal oxide semiconductor materials have shown a great potential in the fabrication of heterojunction thin film due to its improved properties for photovolatic mechanism in solar cell application. In this work, p-(111)-Cu 2 O based heterostructure was successfully developed with uniformity and highly oriented n-TiO 2 /(002)-ZnO bilayer thin film in order to overcome improper electron mobility between the heterointerface of n and p-type layer by optimizing several properties. n-TiO 2 /ZnO bilayer acts as window… Show more

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Cited by 10 publications
(6 citation statements)
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“…Previously, we have studied the effect of annealing temperature on n-TiO 2 /ZnO bilayer thin film by using sol-gel spin coating method. The results showed high crystallinity of thin film with significant modification in morphological and optical properties when the annealing temperature reached up to 500 • C [20]. In this present work, the n-TiO 2 /ZnO bilayer thin film proposed as window layer was constructed with different annealing time.…”
Section: Introductionmentioning
confidence: 78%
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“…Previously, we have studied the effect of annealing temperature on n-TiO 2 /ZnO bilayer thin film by using sol-gel spin coating method. The results showed high crystallinity of thin film with significant modification in morphological and optical properties when the annealing temperature reached up to 500 • C [20]. In this present work, the n-TiO 2 /ZnO bilayer thin film proposed as window layer was constructed with different annealing time.…”
Section: Introductionmentioning
confidence: 78%
“…The intensity was increased as the annealing time increased. However, the preferred (002)-orientation of ZnO thin film appeared at 34.28 • when the annealing time was up to 2 h. This highly oriented (002)-ZnO as window layer is essential for the next deposition of p-Cu 2 O thin film due to the low lattice mismatch of 7.6% exhibited in atomic arrangement of p-n heterojunction thin film [20]. Based on the results, other peaks except TiO 2 and ZnO were undetected.…”
Section: Structural Propertiesmentioning
confidence: 99%
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“…To examine its structural properties, X-ray diffraction spectroscopy was employed, utilizing a 2θ range spanning from 20 to 80 • , and Cu Kα radiation with a 1.54056 Å wavelength was used to analyze the crystal structure. The crystallite size of the n-TiO 2 /ZnO bilayer thin film was calculated using Scherrer Equation (1) [24].…”
Section: Methodsmentioning
confidence: 99%