2021
DOI: 10.1016/j.apsusc.2020.147864
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Development of the phase composition and the properties of Ti2AlC and Ti3AlC2 MAX-phase thin films – A multilayer approach towards high phase purity

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Cited by 35 publications
(15 citation statements)
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“…The XRD spectrum of Ti 3 AlC 2 additionally shows the formation of some aluminum oxide (Al 2 O 3 ) at the surface due to Al out‐diffusion during annealing. [ 35 ] Minor Al 2 O 3 peaks are located at 29.21° and 34.78°. Due to their low intensity, Al 2 O 3 has minor or even negligible contributions to the evaluated properties.…”
Section: Resultsmentioning
confidence: 99%
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“…The XRD spectrum of Ti 3 AlC 2 additionally shows the formation of some aluminum oxide (Al 2 O 3 ) at the surface due to Al out‐diffusion during annealing. [ 35 ] Minor Al 2 O 3 peaks are located at 29.21° and 34.78°. Due to their low intensity, Al 2 O 3 has minor or even negligible contributions to the evaluated properties.…”
Section: Resultsmentioning
confidence: 99%
“…Hardness values found in the literature range between 4.5–15.8 and 1.0–11.4 GPa for Ti 2 AlC and Ti 3 AlC 2 , respectively. [ 35 ] It can be seen that the hardness shows a significant scattering for both thin films for low penetration depths or low applied loads. The roughness of the Ti 2 AlC (4 nm) and Ti 3 AlC 2 (12 nm) films may influence the standard deviation of the measurements at low penetration depths.…”
Section: Resultsmentioning
confidence: 99%
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“…Mass production approaches of (f) roll-to-roll technique and (g) wafer-scale deposition of MXene materials. (a) Reprinted with permission from ref . Copyright 2021 Elsevier.…”
Section: New Mxenes Discoverymentioning
confidence: 99%