Technology Computer Aided Design 2013
DOI: 10.1201/b14860-6
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Device Simulation Using Silvaco ATLAS Tool

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Cited by 7 publications
(3 citation statements)
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“…The mobility model was designed to work in conjunction with the defect density model of electronic states [29]. Physical models such as the IGZO.TOKYO temperature model, Shockley-Read-Hall (SRH) generation and recombination, and Fermi statistical model were used in the simulation process [30]. The ID-VD curve obtained from TCAD simulation showed a consistent trend with the experimental test results as a function of temperature.…”
Section: Resultsmentioning
confidence: 84%
“…The mobility model was designed to work in conjunction with the defect density model of electronic states [29]. Physical models such as the IGZO.TOKYO temperature model, Shockley-Read-Hall (SRH) generation and recombination, and Fermi statistical model were used in the simulation process [30]. The ID-VD curve obtained from TCAD simulation showed a consistent trend with the experimental test results as a function of temperature.…”
Section: Resultsmentioning
confidence: 84%
“…Physical models, such as Shockley-Reid-Hall (SRH) mechanisms, Auger and Langevin mechanisms of recombination, have been applied. In order to obtain the photon production rates along with the continuity equations, the solar spectra (AM1.5G) were imported into Atlas using the BEAM statement [8]. The change of current density versus voltage (J-V) under light was obtained, from which the main PV parameters were extracted, and Jsc, Voc, fill factor (FF), and PCE were calculated.…”
Section: Structure and Simulation Methodsmentioning
confidence: 99%
“…Here, the impact of the corner spacer on the DC performance of the JL MOSFET has been discussed in depth. SILVACO ATLAS [25][26] has been used for the device simulation. Hence, the proposed device-based digital logic circuits have been implemented and their DC performances are compared with the conventional JL MOSFETs.…”
Section: Introductionmentioning
confidence: 99%