Diagnosis of Multiple Scan-Chain Faults in the Presence of System Logic Defects

Chen, Zhe; Seth, Sharad; Xiang, Dong; Bhattacharya, Bhargab B.

doi:10.1109/ats.2011.61

Cited by 9 publications

(4 citation statements)

References 11 publications

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“…Multiple studies have been conducted to maximize the diagnostic resolution of scan chain diagnosis [19]- [25], [27]- [30]. These comprise two categories: diagnosis of a single fault in a single chain and diagnosis of the multiple faults in the entire circuit.…”

Section: Previous Studiesmentioning

confidence: 99%

“…Although the multiple faults may exist in a chain at the initial process stage, these methods only diagnose a single dominant fault closest to the scan-in or the scan-out ports, irrespective of the number of actual faults. Accordingly, studies have been conducted on methods to diagnose not only a single fault in a single chain but also multiple faults in the entire circuit [27]- [30]. The methods proposed in these studies are based on the flush tests of scan paths that can diagnose both stuck-at and transition-delay faults.…”

Section: B Diagnosis Of Multiple Faultsmentioning

confidence: 99%

“…A previous study [27] proposed a diagnostic method using a double tree scan (DTS) architecture designed for a lowpower scan test [26]. Faults are diagnosed on the DTS architecture using the flush tests through the several branching scan paths.…”

Section: B Diagnosis Of Multiple Faultsmentioning

confidence: 99%

“…Scan chain diagnosis methods are classified into three categories: tester-based [3]- [7], software-based [8]- [18], [31], [32] and hardware-based diagnosis [19]- [25], [27]- [30]. Tester-based diagnosis uses testers such as laser provers or current meters to observe defective responses.…”

Section: Introductionmentioning

confidence: 99%

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Reconfigurable Scan Architecture for High Diagnostic Resolution

2021

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Scan chain diagnosis is essential to solving yield-reduction problem caused by the miniaturization of manufacturing process. The accurate diagnosis of scan chain faults that frequently occur in the initial process is vital for rapidly improving yield. Moreover, the importance of scan chain diagnosis with a high resolution for the multiple faults is increasing because multiple faults occur in the early stages of the process, further increasing the cost of physical failure analysis. Although multiple faults can be diagnosed with existing methods, a high diagnostic resolution is difficult to achieve in the early stages of the process (where many faults occur) due to the rapid increase in the number of diagnosed fault candidates as the number of actual faults in the circuit increases. In this paper, a novel reconfigurable scan architecture that reconfigures the diagnosis paths and a test algorithm that uses this scan architecture are proposed to reduce the number of diagnosed fault candidates in the scan chain diagnosis with multiple circuit faults. Experimental results indicate that the proposed method achieves the higher diagnostic resolution for multiple faults than conventional methods. In addition, the proposed method reduces the routing overhead by scan partitioning.

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Section: Previous Studiesmentioning

confidence: 99%

Section: B Diagnosis Of Multiple Faultsmentioning

confidence: 99%