2008
DOI: 10.1063/1.2927470
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Dielectric and ferroelectric properties of strain-relieved epitaxial lead-free KNN-LT-LS ferroelectric thin films on SrTiO3 substrates

Abstract: We report the growth of single-phase (K0.44,Na0.52,Li0.04)(Nb0.84,Ta0.10,Sb0.06)O3 thin films on SrRuO3 coated ⟨001⟩ oriented SrTiO3 substrates by using pulsed laser deposition. Films grown at 600°C under low laser fluence exhibit a ⟨001⟩ textured columnar grained nanostructure, which coalesce with increasing deposition temperature, leading to a uniform fully epitaxial highly stoichiometric film at 750°C. However, films deposited at lower temperatures exhibit compositional fluctuations as verified by Rutherfor… Show more

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Cited by 51 publications
(34 citation statements)
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“…For the films deposited at 750 C, a single perovskite phase with intense (001) oriented peaks is observed in the y-2y scan. The phi-scan of the (011) pole consists of four peaks separated by 90 which indicates the locking of in-plane orientational symmetry and confirms that the films are grown epitaxially [105].…”
Section: Knn Films Prepared By Physical Deposition Techniquessupporting
confidence: 51%
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“…For the films deposited at 750 C, a single perovskite phase with intense (001) oriented peaks is observed in the y-2y scan. The phi-scan of the (011) pole consists of four peaks separated by 90 which indicates the locking of in-plane orientational symmetry and confirms that the films are grown epitaxially [105].…”
Section: Knn Films Prepared By Physical Deposition Techniquessupporting
confidence: 51%
“…At lower temperatures, the RBS profile shows a considerable discrepancy between the experimental and simulated data caused by low atomic mobility and higher surface roughness of the film [105].…”
Section: Knn Films Prepared By Physical Deposition Techniquesmentioning
confidence: 89%
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“…2(d). The leakage current of Mn-doped KNN-KNT-LS and KNN-KNT-LS films reported in the literatures are two and five order magnitudes higher than our KNN-KNT-LT film, respectively [7,9]. Hence, the defect contributions to the polarization and dielectric constant should be small.…”
Section: Resultsmentioning
confidence: 99%